SMT Equipment

NF120 AW AXI(Auto X-ray Inspection) System

Company Information:

X-ray|LINAC|SEM(Scanning Electron Microscope)|PKG System

Suwon, South Korea

Manufacturer

  • Phone +82-31-215-7341

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NF120 AW AXI(Auto X-ray Inspection) System

NF120 AW AXI(Auto X-ray Inspection) System

Name:

NF120 AW AXI(Auto X-ray Inspection) System

Category:

Inspection

Offered by:

SEC

   

NF120 AW AXI(Auto X-ray Inspection) System Description:

Wafer-level Product In-line(Ireland) 2D, 3D CT AXI Machineā€‹

Automatic inspection equipment exclusively for the Wafer-level products and ultra-fine defects of mm can be detected using the Nano Tube of Class Focal spot 200nm. 2D, 
as well as 70º Tilt's oblique CT method, accurately detects defects in overlapping areas that are difficult to read with 2D and 2.5D images in 3D images. 
In addition, the X-ray Image Free Technique of the check can be applied to minimize the damage received by semiconductors.

  • Auto Inspection X-ray Machine for Wafer-level Product
  • detection microscopic defects of several μm using Nano Tube(Focal Spot 200nm)
  • Minimize the damage of product by X-ray Damage-Free Technique

X-ray Tube 120kV / 200µA
X-ray Detector   3.2MPixel FPD, 30fps      
Min. Resolution    200nm
Inspection Item Micro Bump – Missing, Short, Bridge, Open, Void, Non-wet, Etc.
TSV – Alignment, Void, Void, Non-wet, Etc.
BGA, Bump, Solder Ball, Via hole
CT Scan Type Oblique CT
Application Wafer-level

NF120 AW AXI(Auto X-ray Inspection) System was added in Aug 2020

NF120 AW AXI(Auto X-ray Inspection) System has been viewed 161 times

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