InspectScan VPI is a fully integrated, stand-alone process control, measurement and inspection and programming workstation for use in setting up processes before the production floor in the PCB or Hybrid Microcircuit assembly industries. InspectScan
New Equipment | Test Equipment
Instant Evaluations With Just One Touch. LCR-Reader from Siborg Systems Inc. is the newest model in the Smart Tweezers line of handheld LCR-meters. The new LCR-Reader features fully automatic L, C, R and ESR measurements. Smart Tweezers have become
New Equipment | Test Equipment
5720A Multifunction Calibrator: The lowest uncertainties of any multifunction calibrator Since its introduction in 1988, the 5700A Multifunction Calibrator has earned a worldwide reputation for performance, dependability and quality, and as a resul
Improve test coverage and reduce cost. The XJTAG XJLink2-CFM adds the power of XJTAG’s boundary scan solution to the Teradyne TestStation, giving test access to hard-to-probe parts of a board. Both JTAG and non JTAG devices, such as Flash, RAM, Eth
Laser Depaneling of Populated PCBs Low Cost Option for Depaneling Inexpensive Entry into UV Laser Processing The LPKF MicroLine 1120 S is perfect for cutting break-out tabs and complex contours at highest accuracy. The benefits include shorter
Jet printing for high mix production The MY500 Jet Printer is a breakthrough innovation. Well proven on five continents, it shoots solder paste on the fly at split-second speeds while moving above the board. The MY500 is designed to keep pace with
New Equipment | Assembly Services
Technical requirements: Material: FR-4 Layer: 2 layer Thickness of cooper: 1/1 Oz Thickness of board: 1.6MM Surface finish: HASL LF Min. hole size: 0.25mm Min.line width: 0.15mm Min.line space: 0.15mm Contact way: Mail: sales(at)hitechpcb.com www.h
New Equipment | Test Equipment
Improve both board test coverage and test throughput at in-circuit test with i3070 and i1000D ICT systems that offer one of the best ROICs available in the market today. The Medalist i3070, the next generation In-Circuit Test System, enables 20% mo
Highly Accurate Fully Automatic Wafer Inspection with Handling Unit For semiconductor assemblies, the requirement for a precise, thorough inspection for damage and defects during the production process is especially high. Wafers need non-destructive
New Equipment | Test Equipment
The 2800 series of Huntron® Tracker® are designed to complement conventional test instruments in the debug and troubleshooting process. Using the proven power-off test method known as Tracker Signature Analysis it eliminates the risk of further circu