Used SMT Equipment: closed cell (Page 1 of 1)

Vitronics XPM2 + 520

Vitronics XPM2 + 520

Used SMT Equipment | Soldering - Reflow

Heating zones: 5 Cooling zones: 2 Total heating length: 66 in. Total cooling length: 26 in. Total process length: 127 in. Total on /off load length: 11 in. Overall system length: 138.5 in. Overall system width: 52 in. Overall system height: 5

SMTUNION

Vitronics XPM 2 820

Vitronics XPM 2 820

Used SMT Equipment | Soldering - Reflow

2009 Vitronics XPM2 Reflow Oven has Left to Right. 8 heating zones and 2 cooling zones. Only in use 6 months. 208V, 3 Phase, 60 Hz. System:     * 8 top and bottom forced convection heat cells and 2 top and bottom cooling cells     * Overall syst

Key Tech Solutions

Vitronics Soltec XPM2-series Lead Free R

Vitronics Soltec XPM2-series Lead Free R

Used SMT Equipment | Soldering - Reflow

Sku #16534: For questions, additional details and pricing please call or email us! • Pristine - Low Hours ! - Minimal Usage ! • Process Length 13.55 x 5.35 feet ( 413 / 163 cm )  • Heat Zones 7 Top / 7 Bottom • Heating -

SMT Devices

Agilent E6621A-503

Agilent E6621A-503

Used SMT Equipment | In-Circuit Testers

The E6621A PXT instrument represents a significant breakthrough in LTE UE testing. It incorporates flexible base station/network emulation and RF parametric tests into one integrated unit and extends Agilent’s unmatched portfolio of LTE test solution

Test Equipment Connection

Agilent E6621A

Agilent E6621A

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight E6621A PXT Wireless Communications Test Set The E6621A PXT instrument represents a significant breakthrough in LTE UE testing. It incorporates flexible base station/network emulation and RF parametric tests into one integrated

Test Equipment Connection

Agilent E6621A

Agilent E6621A

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight E6621A PXT Wireless Communications Test Set The E6621A PXT instrument represents a significant breakthrough in LTE UE testing. It incorporates flexible base station/network emulation and RF parametric tests into one integrated

Test Equipment Connection

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