Industry News: hioki (Page 1 of 3)

UA1780 Fit-Line Inspection Data Creation System from Seika Supports the New HIOKI FA1240 Flying Probe Tester

Industry News | 2014-03-18 10:41:09.0

Seika Machinery, Inc. has introduced the new UA1780 Fit-Line Inspection Data Creation System to support the new HIOKI FA1240 Flying Probe Tester.

Seika Machinery, Inc.

Seika Machinery Introduces HIOKI UA1780 Gerber Data Editing Software for Flying Probe

Industry News | 2013-02-11 08:41:05.0

Seika Machinery, Inc. introduces the new HIOKI UA1780 Gerber Data Editing Software to be used in conjunction with the HIOKI 1240 Flying Probe ICT.

Seika Machinery, Inc.

Seika’s Manufacturer Awarded Prime Minister’s Green Campaign Award

Industry News | 2010-02-08 12:03:17.0

TORRANCE, CA — February 2010 — Seika Machinery, Inc., a leading provider of advanced machinery, materials and engineering services, announces that HIOKI, the manufacturer of Seika’s 1240 Hioki Flying Probe Tester and ICT systems, was nominated as one of the recipients of the 2009 Green Campaign Award of the office of the Japanese Prime Minister.

Seika Machinery, Inc.

Video Demonstration for HIOKI 1240 Flying Probe Tester with New Software Programming Feature Is Now Live on Seika TV

Industry News | 2013-04-18 11:08:20.0

Seika Machinery, Inc., announces that it has added a video demonstration of the HIOKI 1240 Flying Probe Tester with the new software programming feature to Seika TV.

Seika Machinery, Inc.

Hioki’s Hiroshi Yamazaki to Present at the IPC APEX EXPO

Industry News | 2014-03-18 14:06:50.0

Seika Machinery, Inc. today announced that Hiroshi Yamazaki, Assistant Manager at Hioki E.E. Corporation, will present during the APEX 2014 Technical Conference Session Test II on Thursday, March 27, 2014 from 10 a.m.-12 p.m. at the Mandalay Bay Convention Center in Las Vegas, NV.

Seika Machinery, Inc.

Seika Machinery, Inc. Debuts HIOKI’s High-Speed 1240 Series X-Y IN-CIRCUIT HiTESTERs

Industry News | 2011-02-11 13:21:48.0

Seika Machinery, Inc. introduces HIOKI’s X-Y IN-CIRCUIT HiTESTER 1240 Series of high-speed, high-precision, high-reliability populated board flying probe testers that are ideal for high-mix/low-volume production.

Seika Machinery, Inc.

Seika to Promote Its Latest Router and Probe Tester at SMTA Wisconsin

Industry News | 2013-09-13 07:05:50.0

Seika Machinery, Inc.announces that it will highlight the Sayaka SAM-CT23W and HIOKI 1240 at the SMTA Wisconsin/Great Lakes Expo & Tech Forum, scheduled to take place Wednesday, September 18, 2013 at the Crowne Plaza Milwaukee Airport in Wisconsin.

Seika Machinery, Inc.

Seika to Highlight HIOKI and Product Literature at SMTA Houston Expo & Tech Forum

Industry News | 2010-02-08 12:05:06.0

TORRANCE, CA — February 2010 — Seika Machinery, Inc., a leading provider of advanced machinery, materials and engineering services, announces that it will highlight its HIOKI Flying Probe ICT with AOI functions at the upcoming SMTA Houston Expo and Tech Forum, scheduled to take place Thursday, March 4, 2010 at the Stafford Centre in Stafford, TX.

Seika Machinery, Inc.

Seika Goes to the SMTA Carolinas Expo & Tech Forum

Industry News | 2014-01-09 11:15:15.0

Seika Machinery, Inc. announces that it will attend the SMTA Carolinas Expo & Tech Forum, scheduled to take place Thursday, January 23, 2014 at the Double Tree Raleigh Brownstone – University in Raleigh, NC. Seika will highlight the new HIOKI 1240 Flying Probe Tester and proven McDry Cabinets.

Seika Machinery, Inc.

Circuits Assembly Awards Seika Machinery for Test & Inspection – ICT

Industry News | 2014-03-26 08:48:51.0

Seika Machinery, Inc.announces that it has been awarded a 2014 NPI Award in the category of Test & Inspection – ICT for its HIOKI FA1240 Flying Probe Tester.

Seika Machinery, Inc.

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