Industry News | 2020-03-12 06:20:11.0
STI's Mark McMeen, VP, Engineering Services, will have a special presentation on How does one collect "Objective Evidence" to meet the new J-STD-001 Section 8.1 on electronic assembly cleanliness? The presentation take place at STI Electronics Inc.'s facility in Madison, AL on March 26, 2020 at 3 p.m. and will explore why this IPC standard came about and why the current "ROSE" test methodology is not enough for today's advanced designs. It will explore different tools and techniques as well as discuss how to gather objective evidence needed to meet the specification. There will be an actual demonstration of the equipment and test reports that are generated by the SIR test equipment along with the actual hardware that generates the test data that supports "Objective Evidence" for review. Do you know how "clean or dirty" your electronic manufacturing process and resulting hardware/assemblies are at completion?
Industry News | 2015-01-13 11:54:43.0
Indium Corporation's Eric Bastow, assistant technical manager, will present at IPC APEX Expo 2015 on Feb. 24 in San Diego, Calif. Bastow's presentation, Can Age and Storage Conditions Affect the SIR Performance of a No-Clean Solder Paste Flux Residue?, explores the electrical reliability of two no-clean solder pastes stored under various conditions and aged over different time intervals.
Industry News | 2022-05-05 12:07:32.0
Gen3 a British manufacturer of testing and measuring the electronics industry announced that Dr Chris Hunt, CTO, will present during the SMTA Electronics in Harsh Environments Conference.
Industry News | 2022-05-05 12:07:38.0
Gen3 a British manufacturer of testing and measuring the electronics industry announced that Dr Chris Hunt, CTO, will present during the SMTA Electronics in Harsh Environments Conference.
Industry News | 2017-01-26 10:40:46.0
Gen3 Systems Limited, a specialist British manufacturer and distributor, is pleased to announce that its Production Manager Mark Routley will present the paper titled “Process Control of Ionic Contamination achieving 6-Sigma Criteria in the assembly of Electronic Circuits” alongside Dr Pierre Eckold of Robert Bosch at the upcoming IPC APEX EXPO.
Industry News | 2012-11-22 03:27:45.0
The clinic is organized by IPC and National Physical Laboratory
Industry News | 2013-02-06 11:45:08.0
Practical Components announces that some of its products will be featured by Bob Willis in the Printed Board Assembly Cleaning and Contamination Testing Center during the upcoming IPC APEX Expo
Industry News | 2014-11-13 14:10:51.0
STI Electronics, Inc., a full service organization providing training services, analytical and failure analysis, prototyping, and small- to medium-volume PCB assembly, announces that Mark McMeen, VP of Manufacturing and Engineering Services, will present during the High-Reliability Cleaning and Conformal Coating Conference, Nov. 18-20, 2014 at the Chicago Marriott Schaumburg in Illinois. Organized by IPC and SMTA, the High-Reliability Cleaning and Conformal Coating Conference will cover technological developments in all areas of cleaning and coating applied to electronics assemblies.
Industry News | 2016-04-22 10:20:35.0
Kester is proud to announce the launch of SELECT-10™Selective Solder Flux, a zero-halogen no-clean liquid flux designed specifically for the needs of the selective soldering process. As part of Kester’s portfolio of high reliability products, SELECT-10™ has passed IPC SIR testing as a raw and partially activated flux. Sustained activity within the flux allows for good barrel fill in challenging and high temperature applications. Specific to selective soldering, SELECT-10™ does not spread beyond the spray pattern and will not clog nozzles. SELECT-10™ is classified as ROL0 flux under IPC J-STD-004B.
Industry News | 2022-06-28 09:47:45.0
Gen3 a British manufacturer of testing and measuring the electronics industry announced that Dr Chris Hunt, CTO, has written a paper for SMTA on a gage study of an intercomparison evaluation to implement the use of fine-pitch test patterns for surface insulation resistance (sir) testing of solder fluxes.
