Electronics Forum | Mon Aug 27 19:24:00 EDT 2001 | sharafali
It has been mentioned that DPMO offers large advantages over First Pass yield calculations for measuring process performance!!regarding the same I have a few queries: What are the benchmarks for using DPMO as measures of process performance? How is
Electronics Forum | Tue Aug 28 12:25:26 EDT 2001 | Steve
To be honest with you, it doesn't really matter how you present the data, as long as you understand what the problems are. Bottom line is who cares what the numbers are unless you are doing something about it. Are you able to track the individual de
Electronics Forum | Tue Aug 28 13:46:46 EDT 2001 | mparker
To clarify on "Opportunities"- With 1000 components, the opportunities are far greater than 1000. You have 1 opportunity per component for a component defect i.e. bent lead, damaged part, tested bad, etc. You have a second opportunity per component
Electronics Forum | Thu Sep 13 13:29:06 EDT 2001 | mparker
Dave et al, I just print out and read a copy of the aforementioned recommended article. Mr. Mangin gives a clear picture of why DPMO is to be considered a more pure data than First Pass Yield (FPY). However, I must note that his interpretation of h
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