Electronics Forum: halt testing (Page 1 of 4)

No-Clean flux residue from Secondary Ops

Electronics Forum | Mon Sep 23 12:59:12 EDT 2013 | pauldavis4

New pcba supplier sent us first article pcbas (SMT, Wave & hand solder operations) that failed our testing due to no-clean flux residues found under ICs and around passive capacitors. Second lot came in and had 100% pass yield, but we still see a cl

Imm Silver and Voiding

Electronics Forum | Mon Jun 26 23:33:20 EDT 2006 | KEN

We saw this condition over 3 years ago. It sometimes is called "champagne bubbles". The intemetalic formation is interrupted due to the micro voiding reducing mechanical strength. I discovered this on lead free test vehicles for a major computer

Re: HAST and HALT

Electronics Forum | Mon Oct 26 14:56:07 EST 1998 | carl m

| | Hi, | | Am looking out for companies which would perform the "highly accelerated stress testing" for my PCB test assembly samples. does anybody have any info regarding this. | | thanks, | | subhash | | | Most independent PCB test labs, often do

Thermal fatigue of solder joints

Electronics Forum | Thu Oct 26 03:20:13 EDT 2000 | heccles

What would be a typical thermal test regime to verify the quality of solder joints for high specification applications - what would be the specific benefits of utilizing a "HALT" process over other traditional test techniques ?

Re: PCB Material selection

Electronics Forum | Mon Jun 26 20:34:14 EDT 2000 | Dave F

Gary: Allow expand on this topic a bit. Back in the gray skied past when people wore calculators on their belts, rather than pagers n Palms, and didn�t drink California spill, they used HASS that you mentioned and HALT (Highly Accelerated Life Test

IPC Conference Raises New Lead-free Reliability Concerns

Electronics Forum | Wed Apr 18 08:44:15 EDT 2007 | pjc

Every failure analysis study I've seen, (and quite a few by now) showes Pb Free failing in about half the time or cycles as Sn/Pb. HALT and HASS testing shows reality- run way from a Pb Free product other than a camcorder, etc...

Re: HAST and HALT

Electronics Forum | Sat Oct 24 06:07:09 EDT 1998 | Earl Moon

| Hi, | Am looking out for companies which would perform the "highly accelerated stress testing" for my PCB test assembly samples. does anybody have any info regarding this. | thanks, | subhash | Most independent PCB test labs, often doing military

Capacitor securing

Electronics Forum | Thu May 26 09:47:13 EDT 2005 | Dave G

We use the 3748. We picked it many moons ago after doing product HALT & HASS testing. Basically the run of the mill hotmelts didn't hold up as well under the conditions our equipment lives in. (We do a lot of MIL,Aero & Industrial motor/actuator driv

Re: Thermal fatigue of solder joints

Electronics Forum | Sat Nov 25 03:51:04 EST 2000 | carsonho

HALT is an approach to stimulate a failure till its existence. It is mainly used during product design and development phase. Traditional tests are mainly used to prove "no" failure but HALT is to make failure for information to improve in design of

Production Testing - HASS

Electronics Forum | Tue Mar 27 04:23:27 EDT 2007 | donjohnson

You know the products operating limits,and these have been pushed out during development using Highly Accelerated Life Testing (HALT) 2> Proof of Screen has been conducted to ensure that wear out failures are not induced by the screen If the above

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