Electronics Forum | Mon Mar 03 12:14:33 EST 2003 | testing
I am trying to optimise the use of our Automatic Optical Inspection Machines. As the data we collect from the machine is mainly of the attribute type (Pass/fail, Defect1, Defect2, etc), what advice can you provide to improve its use as well as using
Electronics Forum | Thu Mar 02 14:04:30 EST 2006 | amol_kane
do u mean program as in software? Minitab can do all the basic statistical analysis for your data and give you Cp, Cpk Values. The Cp and Cpk values are derived from estimates from the data (hence necessary to have Confidence Intervals). Regards, Am
Electronics Forum | Tue Mar 04 15:34:31 EST 2003 | ROHAN SARKER
Well very interesting...i think a possible solution can be data acquisition via Matlab and then carrying the necessary operations.Can u give details of your works-----I can then get closer to a possible solution.
Electronics Forum | Wed Mar 05 12:23:31 EST 2003 | msivigny
Hello Phil, We did use an Oracle relational database with an Access front end to input and query data from the system for reports. We did not perform SPC with the Oracle dB. As the whole data collection process was completely customized, we hadn't im
Electronics Forum | Thu Jul 14 16:05:55 EDT 2005 | russ
Good answer slthomas! This has got to be the biggest misconception out there. To perform SPC on a wave process you must first perfrom DOE to determine the critical parameters and or control limits. For example you will need temp reading devices tha
Electronics Forum | Fri Jul 15 13:28:55 EDT 2005 | Brian
A process consists of much more than just thee machine. When developing a cause and effect diagram ffor the process, there are many parameters that fall outside the machine itself. There are Man, Machine, Methods, and Materials. Just monitoring th
Electronics Forum | Tue Mar 04 16:50:56 EST 2003 | msivigny
Hello Rohan, this is starting to date nearly 6 years ago but I will remember everything I can, we used a custom interface to input data and everything was stored in a very large database on a specific server only for quality data, I think we used Ora
Electronics Forum | Mon Mar 03 13:18:02 EST 2003 | msivigny
Hello phil, The use of AOI systems give us the opportunity to auto-collect defect information much the way you're using them now. AOI systems become extremely effective when the collected data is used to perform some positive change into the process.
Electronics Forum | Mon Dec 17 11:55:08 EST 2007 | chef
I recently had the same problems, solder bridges on every thing I made, different customers boards, etc. I wave with no-clean flux. As I sorted out problems (pin holes, blow holes, splatter, etc.) I found a lot of variable factors. I changed flux,
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