Electronics Forum: pass (Page 76 of 142)

Big Holes (no Pun intended) in the IPC610D Criteria for Shrink/t

Electronics Forum | Fri Feb 17 13:10:34 EST 2006 | amol_kane

I have Immersion Ag and Immersion Sn LF boards that were waved using SAC305 alloy. I have a lot of tears/shrink voids in the waved connections. I am aware that SAC305 in wave has a propensity of shrink tears/voids due to the non eutectic property of

Yellowish

Electronics Forum | Tue Oct 03 17:04:07 EDT 2006 | cuculi54986@yahoo.com

Glenn, What alloy are you using for Pb-free HASL? You say tin copper nickel, but is it SN100C? Against manufacturing engineering's recommendation, my company specified simply "Pb-free HASL" as the finish for our Pb-free PCBs. One of our suppliers

JUKI VS. Siemens ? Which to choose?

Electronics Forum | Sat Feb 10 04:17:40 EST 2007 | Grant

Hi, I don't know about other peoples experience, but I have decided i absolutely HATE auto teach. The problem is with auto teach you just measure one component, and then you need to open up the tolerance to get an acceptable pass rate. Which means

ICT

Electronics Forum | Mon Mar 12 08:24:30 EDT 2007 | rgduval

ICT is generally a manufacturing verification test. Coverages vary depending on the board. I've run lots with as low as 25% coverage on the board (but produced 98% FPY post board assembly). Functional test is exactly what it sounds like. Checking

Ionic contamination vs selective soldering ?

Electronics Forum | Mon Mar 17 18:37:59 EDT 2008 | aqueous

We manufacture both bulk and localized ionic contamination testers. My answer is from the perspective of the cleanliness testing method. The issue with all bulk ionic contamination testers (Ionagraph, Omegameter, Zero-Ion), is that they test the en

BGA failure when chamber test

Electronics Forum | Mon Mar 21 02:41:29 EDT 2011 | kemasta

Hi It's me again. Our products need to pass a chamber test 45c/36hrs after the PCBA completed batch of functional tests and assemble in to case. We found 1 unit was functioning for 24hours in the chamber, but hang after that. We tried to re-boot the

ICT testing to improve yields

Electronics Forum | Mon Aug 27 08:52:57 EDT 2012 | rgduval

Reese, We would agree about the value of an ICT system, in a general manufacturing environment. However, a couple of notes apply: 1. ICT isn't a catch-all, either, and should be used to verify the process, not validate it. Quality should be buil

AOI False Calls

Electronics Forum | Thu Feb 28 10:22:46 EST 2013 | rway

If your silkscreen is too close to the toes of your leads, you can bring the lead bank inspection box in a little bit to compensate. I haven't had many issues with tantalum caps. I inspect those under white light with no filter just fine, but then

MPM HiE E00900 Fault

Electronics Forum | Mon Jan 25 15:51:02 EST 2016 | aemery

SP1 is a bi-metal spring loaded switch or the "air fault" switch on the main air manifold that detects the presence of an appreciate amount of air being supplied to the machine. Air pressure overcomes the adjustable spring and closes the contacts.

Universal GSM1 Axis Head 1 Z Time Out Error

Electronics Forum | Mon May 02 23:42:44 EDT 2016 | ttheis

I have a strange issue where all 4 spindles of head 1 on my GSM1 are able to place small parts without a problem until the very end of the routine where a large electrolytic aluminum capacitor is placed. The part is successfully picked out of the fee


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