Electronics Forum | Fri Apr 12 15:48:33 EDT 2002 | jersbo
SPC for each assembly(I use C(for board defects)NP(for unit defects) at the end of reflow to determine process capabilities determine Control limits. Once control limits are set, inspectors stop the process until out of control limit is addressed and
Electronics Forum | Fri Aug 16 06:52:00 EDT 2002 | Bach Huss
We are using the MVT as our AOI Machine. Some how after the reflow (in Testing) we still find defects. We think missing part should not happen once we have the MVT. However there are still escapee from the MVT (0.5 %). We are actually planning to h
Electronics Forum | Wed Mar 05 13:37:20 EST 2003 | msivigny
Hello James, It sounds like the system that's being used to gather this data is an AOI system. I will investigte this more because I'm very curious of the process in which this works. I'll keep an eye out for someone using this setup and may get back
Electronics Forum | Thu Sep 04 16:44:19 EDT 2003 | mleber
We are a military contractor running mixed technology CCA's. We currently "map" all defects off reflow and wave by indicating the defect on a map (plot from gerber) then passing it on to rework. The map is used for SPC data as well as overall perform
Electronics Forum | Wed May 26 09:42:38 EDT 2004 | davef
There's a fair amount of "how to do SPC charts" on the web. For instance: http://www.isixsigma.com/offsite.asp?A=Fr&Url=http://www.sytsma.com/tqmtools/charts.html Requirements for: * Dot dispensing criteria include: volume, height, diameter, and p
Electronics Forum | Wed Sep 22 19:10:39 EDT 2004 | Rush Fan
I was wondering if anyone has ever considered measuring the belt speed of their reflow ovens using some type of hand-held, preferably non-contact device? If so, could you recommend a manufacturer of such a device? We are considering measuring our act
Electronics Forum | Thu Jun 09 19:09:37 EDT 2005 | Kantesh Doss
We verify oven profiling once a week on a scrap board and enter the data in a SPC Chart. This works out great and I have not noticed any problem. I also like the idea of sending the Profiler through the oven with the thermocouple sticking out to meas
Electronics Forum | Fri Jul 15 10:34:28 EDT 2005 | dougs
how do you do it stephen? i'm interested to know what methods can be used to monitor a process such as this. is it best to set-up the wave machine parameters as russ and davef were talking about, what then, how do we know what effect a change in
Electronics Forum | Tue Feb 07 10:11:06 EST 2006 | amol_kane
hi, the only way you can say that the process is in/out of control is to plot the values (mean) of a metric against the 3 sigma limits for a Xbar chart, or plot a individuals run chart. you can also do a capability analysis nased on a metric (say,
Electronics Forum | Thu Feb 16 09:00:35 EST 2006 | russ
Samir, You are a nut! I wouldn't cut your hands off! I asked because I was wondering about the stability and repeatability of the wave machine itself being used as the standard. I do understand Gage R&R or at least I think I do that was why I aske