Electronics Forum | Thu Feb 26 09:18:46 EST 2015 | swiese242
We have an older version of DBA and are currently looking into Next GEN DBA. I would like more insight to how other manufactures handle their inventory, whether a FIFO or kitting process. Thanks.
Electronics Forum | Thu Oct 17 17:18:48 EDT 2002 | Leandro G. Barajas
Hi everybody, This is a simple posting to initiate a discussion on different ways to troubleshoot, improve, and control the Stencil Printing Process SPP in SMT manufacturing. There are many SPC, ANOVA and other analysis techniques that provide insi
Electronics Forum | Fri May 23 15:31:46 EDT 2003 | daanterstegge
Hi ChrisX, DPMO = number of defects per million opportunities. PPM (parts per million) is exactly the same, although the terminology is less clear about what it means. SPC(statistical process control) is a methodology based on statistical technique
Electronics Forum | Wed Mar 02 18:46:02 EST 2005 | Austinj
The tendancy always has been "when in doubt, touch it up"... this is not the way to "verify the process" and is not the best strategy for multiple reasons (unessecary rework, additional labor costs, as well as making the solder joint more brittle, [i
Electronics Forum | Mon Mar 03 11:06:13 EST 2003 | msivigny
Hi floydl, I completely understand when it comes to data crunching after long hours of performing measurements, it's the last and most important arduous task in obtaining performance data. If a measurement and evaluation process that traditionally to
Electronics Forum | Fri Jul 15 12:41:56 EDT 2005 | russ
You are not wrong in monitoring the Product (your really not monitoring the process). This methodology is valuable if your process is unstable (SPC is used to stabilize process). There is value in "real time" inspection of a process's product as lon
Electronics Forum | Mon Jul 18 18:36:01 EDT 2005 | slthomas
"thomas, why isn't it process control," Minute detail, really. Defects aren't a measurement of process parameters, they're the result of them (and a few other things that have been mentioned). SPC measures process parameters. It is preemptive, and
Electronics Forum | Fri Jul 15 03:29:52 EDT 2005 | dougs
thomas, why isn't it process control, you cant just think that because you've set up your machine properly ( pot temp, wave height, pre-heat etc etc )that everything is going to be ok, there are other factors that you wont find with wave riders or
Electronics Forum | Mon Mar 03 13:18:02 EST 2003 | msivigny
Hello phil, The use of AOI systems give us the opportunity to auto-collect defect information much the way you're using them now. AOI systems become extremely effective when the collected data is used to perform some positive change into the process.
Electronics Forum | Sat Jan 25 17:46:07 EST 2003 | testing
I am currently finding it challenging(help!) to determine how I can introduce SPC ontrol within the AOI process and how the AOI can help control other SMT processes. Can someone please provide me with some ideas or any of excels fancy charts/macro
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