Electronics Forum | Fri Sep 21 17:46:07 EDT 2007 | chrisgriffin
Right you are. Count on it taking at least an hour if you've never done it before. I think they made the pro-head way too complicated. Standard UP style heads are so much easier.
Electronics Forum | Sun Sep 23 20:21:31 EDT 2007 | simmcircuits
Dear All, Many thanks for all your assistance and responses. I have already emailed Chris for the procedure. We will try to fix it first before we call in for service. Thank you all, it is much appreciated. Regards
Electronics Forum | Tue Oct 02 16:00:03 EDT 2007 | stimpk
Do you still this done? What type of rework is required? Please provide a little more info.. ksimpson@spectralresponse.com
Electronics Forum | Wed Sep 19 16:20:46 EDT 2007 | highspeed
Can anybody tell me what an error code 6 means after a GSM Calibration.
Electronics Forum | Thu Sep 20 12:20:45 EDT 2007 | jsloot
What kind and what brand of gloves are people using for handling hot wave solder pallets? My operators are going through a pair a week. I need something better. Thanks
Electronics Forum | Fri Sep 21 10:33:56 EDT 2007 | russ
we use welders gloves with cuffs. there are some other heat gloves out there as well, we like the durability of leather though Russ
Electronics Forum | Thu Sep 20 14:58:17 EDT 2007 | jax
For multiple products, none of which have test points, you might want to think about a Flying Probe. Although not as fast as ICT, it should have higher flexibility.It's also easily modified without large tooling/fixture costs.
Electronics Forum | Thu Sep 20 20:24:09 EDT 2007 | davef
Welcome back to SMTnet, bubba. Depending on your goal select from: * Manufacturing defects tester * In-circuit tester
Electronics Forum | Fri Sep 21 11:48:26 EDT 2007 | chef
My past experience included flying probe- we used it as more an R&D tool, it obvious wasn't fast enough for production. Once the probe gave us the answers need, we then developed the HP 3070 test bed and program.
Electronics Forum | Sat Sep 22 23:57:53 EDT 2007 | accurex
The selection of Test equipment primarily should be driven by the requirement of fault spectrum you would like to capture. If you are looking at Manufacutring defects MDA/ICT would do the job, if you would like to cover the functional aspect a combin
