Conductive Anodic Filament (CAF) Formation: A Potential Reliability Problem for Fine-Line Circuits
Published: |
March 16, 2023 |
Author: |
Laura J. Turbini, W. Jud Ready & Brian A. Smith |
Abstract: |
Outline * Introduction & Background * Factors Affecting CAF Formation * CAF Formation ** Catastrophic Field Failure of Military Hardware ** Laboratory Experiments * Conclusion... |
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