Effect of Process Variations on Solder Joint Reliability for Nickel-based Surface Finishes
Published: |
November 6, 2014 |
Author: |
Hugh Roberts, Sven Lamprecht, Gustavo Ramos, Christian Sebald |
Abstract: |
This paper summarizes the results of recent investigations to examine the effect of electroless nickel process variations with respect to Pb-free (Sn-3.0Ag-0.5Cu) solder connections. These investigations included both ENIG and NiPd as surface finishes intended for second level interconnects in BGA applications. Process variations that are suspected to weaken solder joint reliability, including treatment time and pH, were used to achieve differences in nickel layer composition. Immersion gold deposits were also varied, but were directly dependent upon the plated nickel characteristics. In contrast to gold, different electroless palladium thicknesses were independently achieved by treatment time adjustments.... |
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