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Guide for the Design of Semiconductor Equipment to Meet Voltage Sag Immunity Standards

Published:

August 5, 1999

Author:

Mark Stephens, Dennis Johnson, John Soward, Jim Ammenheuser

Abstract:

This document summarizes the finding of testing to determine the immunity of semiconductor equipment to voltage sag events. Based in part on the findings, global standards have been adopted to define voltage sag immunity requirements for semiconductor equipment......

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Company Information:

An association of member companies cooperating on research in key areas of semiconductor technology, with a strong focus on thin-film photovoltaic (PV) manufacturing.

Albany, New York, USA

Association / Non-Profit

  • Phone (518) 649-1000

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Company Postings:

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