Tektronix TDS7104
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Tektronix TDS7104 |
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Florida, USA |
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Tektronix TDS7104
Bandwidth: 1.0 GHz Channels: 4
Digital Phosphor Oscilloscope; 1GHz, 4 Channel
Tektronix TDS7104 Digital Oscilloscope, 4 CH, 1 GHz
TDS7000 Series Digital Phosphor Oscilloscopes are high performance solutions for verification, debug and characterization of sophisticated electronic designs. The family features exceptional signal acquisition performance, operational simplicity and open connectivity to the design environment. Classic analog-style controls, a large touch-sensitive display and graphical menus provide intuitive control. Open access to the Microsoft Windows operating system enables unprecedented customization and extensibility.
TDS7000 models range from 500 MHz to 4 GHz bandwidth with single-shot sample rates to 20 GS/s, meeting demands of the latest high speed logic families and multi-Gigabit communication standards. Acquisition memory options from 2 to 32 Megasamples maximize the value of high sample rate and ensure that critical events are captured with fine detail.
High performance jitter analysis to 1.5 ps RMS is achieved through exceptional trigger and acquisition performance, deep memory and applied software.
TDS7000 Series high bandwidth signal access solutions include the P7240 4 GHz (120 ps rise time) active probe and the P7330 3.5 GHz (<130 ps rise time, typical, <140 ps guaranteed) differential probe. Small form-factors and a wide array of tip accessories ensure effectiveness. In addition, the TDS7404, TDS7254 and TDS7154 include the TekConnect signal interconnect system. This interface replaces traditional BNC input connectors with a convenient positive-locking interface suitable for higher system bandwidths. P7000 Series probes are directly compatible with TekConnect signal interconnect system along with adapters that provide SMA, BNC and N connections.
Features:
1GHz Bandwidth
Up to 20 GS/ s Real- time Sample Rate
Up to 32 Megasamples Memory Depth
>400,000 Wfms/ second Maximum Waveform Capture Rate
Optional Communications Mask Testing Up to 2 .5 Gb/ s Rates
Optional Clock Recovery from Serial Data Streams
Optional 32-bit Serial Trigger for Isolation of Pattern dependent Effects
10 MHz Timebase Reference Input for Enhanced Accuracy and Repeatability
Graphical User Interface
Control via Classic Direct Controls, Touch-sensitive Color Display or Mouse Navigation
Open Microsoft Windows Environment
Built- in Networking
Options:
1M = 2 Msamples max, 500 ksamples/ch
2M = 8 Msamples max, 2 Msamples/ch
3M = 16 Msamples max, 4 Msamples/ch
1K = K4000 Scope Cart
1R = Rackmount Kit
J1 = TDSJIT2 Jitter Analysis Software
J2 = TDSDDM2 Disk Drive Analysis Software
CP2 = TDSCPM2-ANSI/ITU Telecom Pulse Compliance Testing
USB = TDSUSBS-USB2.0 Compliance Test S/W Only
33 = Add (1) P6158 3 GHz, 20x Low C Probe
36 = Add (1) P6139A 500 MHz, 10x Passive Probe
37 = Add (1) P6245 1.5 GHz Active Probe
39 = Add (1) P6248 1.7 GHz Differential Probe
SM = Serial Comm Mask Testing
UBF = USB Test Fixture
- See more at: https://www.testequipmentconnection.com/11523/Tektronix_TDS7104.php#sthash.F954v7bz.dpuf
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