OptoTherm releases PCB Test Arm Probe

Mar 16, 2007

OptoTherm has added a PCB Test Arm Probe to its product line. The Arm Probe is designed to provide quick and easy probing of surface mount devices (SMD). It can connect a test instrument, such as an oscilloscope, to a variety of SMDs including PLCC, SOIC, QFP, and VIAS or test point holes. The Arm Probe�s heavy base and flexible shaft make positioning to a test point a simple process. Its spring loaded tip, rotatable head, and fine vertical adjustment knob enable precise positioning to adjacent test points, even on very fine pitches. Connect single or multiple test leads to the Arm Probe�s connection post.

There are two models available: a standard model (3 amp) and a high current model (10 amp). When used with an OptoTherm thermal imaging system, the high current model can help locate low ohm shorts. The specifications of the Arm Probe are as follows: Overall length 8.33 inches (211.5mm), Overall Height 2.92 inches (74.2mm), Base Length 2.53 inches (64.3mm).

Please review our website or contact us directly for more information.

Contact info:

OptoTherm, Inc.

2591 Wexford-Bayne Road, Suite 304

Sewickley, PA 15143

Ph: 724-940-7600

Fax: 724-940-7611

Website: http://www.optotherm.com

Email: sales@optotherm.com

Nov 26, 2012 -	OptoTherm introduces IR LabMate infrared camera
Oct 31, 2012 -	OptoTherm names sales rep in Indonesia, Phillipines, Singapore, Thailand, and Vietnam
Oct 03, 2011 -	OptoTherm names sales rep in Malaysia
Jan 19, 2011 -	OptoTherm adds Tianjin Felles Photonic Instruments as sales representative in China
May 30, 2008 -	OptoTherm offers environmental enclosure for EL system
Mar 18, 2008 -	EL thermal imaging system camera upgrade
Oct 04, 2007 -	OptoTherm adds DVS-India as sales representative in India
Jul 13, 2007 -	New Microscopic Thermal Imaging Camera

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