Test Research, Inc. is proud to present the new In-Circuit Tester (ICT) solution BSI Plus.
The BSI (Boundary Scan Interconnect) Plus is TRI's latest ICT solution for different connectors, such as DDR4, USB, PCIe and M.2 SATA. The BSI Plus hardware is easy to integrate into the fixture and setup for new test programs.
Please visit the following link below to learn more about the BSI Plus Series:
Test Research, Inc. (TRI) offers the most robust product portfolio in the industry for Automatic Test and Inspection solutions. From Solder Paste Inspection (SPI), Automated Optical Inspection (AOI), and 3D Automated X-ray Inspection (AXI) systems to Manufacturing Defect Analyzers (MDAs), In-Circuit Test equipment (ICT), and Functional Testing (FCT), TRI provides the most cost-effective solutions to meet a comprehensive range of manufacturing Test and Inspection requirements. Learn more at http://www.tri.com.tw. For sales and service information, please write to us at email@example.com or call +886-2-2832 8918.