SMT, PCB Electronics Industry News
  • SMTnet
  • »
  • Industry News
  • »
  • Gen3's Dr Chris Hunt, CTO to Present at SMTA Electronics in Harsh Environments Conference

Gen3's Dr Chris Hunt, CTO to Present at SMTA Electronics in Harsh Environments Conference

May 05, 2022

Dr Chris Hunt, CTO of GEN3

Dr Chris Hunt, CTO of GEN3

Gen3 a British manufacturer of testing and measuring the electronics industry announced that Dr Chris Hunt, CTO, will present during the SMTA Electronics in Harsh Environments Conference. The presentation, “Objective Evidence and How to Convince the Auditors,” will take place on Wednesday, May 18, 2022, from 16:30 – 17:00 pm at the Park Plaza Victoria Amsterdam.

Gen3’s Dr Chris Hunt will be addressing the question that everyone is facing in the industry globally, what does ”Objective Evidence “ mean / require? 

  • This will be a measurement system that will be repeatable and reproducible, and that can have a metric that directly relates to performance. 
  • For ECM a suitable metric is resistance. 
  • ECM produces corrosion products and ionic current flows that contribute to unwanted circuit elements.
  • A measurement of the isolation resistance between circuit features therefore provides a direct circuit performance metric.
  • SIR and CAF are examples of techniques that measure resistance, and hence provide Objective Evidence .

SIR, for process validation testing, was first established more than 30 years ago. It was a spin-off from the British CFC Elimination Project led by Dr Colin Lea OBE, at the British National Physical Laboratory. With the then advent of no-clean fluxes, it was the only test method to determine electro-chemical reliability and hence acceptable cleanliness as used at that time.

It was recognised as unsuitable for process control and that process ionic contamination testing (PICT) should be maintained for fast and effective control within 15 minutes.

New test methods have been introduced by IEC in the past 2 years:

  • IEC 61189-5-502 – Surface Insulation Resistance (SIR) testing of assemblies - 2021
  • IEC 61189-5-504 – Process Ionic Contamination Testing (PICT) - 2020

Gen3’s presentation will also look at the other test methods and compare their pro’s and con’s, including Ion Chromatography, FTIR, SEM + EDAX and new Digital Microscopy.

A blue screen with white text

Description automatically generated with medium confidence

About GEN3

GEN3. Testing and measuring the electronics industry for over 40 years.  For three generations, Gen3 have designed, engineered, manufactured, and distributed their test and measurement equipment into the electronics industry to shield their clients from failure in the field.

Their reputation for excellence has grown to a global scale. The team is made up of industry experts who work to set the standards around circuit testing, measurement, and compliance.  They collaborate with key industry associations, offering our unique experience and expertise to educate all on what it takes to succeed.  For product protection the preferred way is GEN3, where precision comes as standard, acting as a mentor and your front-line defender. 

In the high-reliability arena, there is too much at stake to allow room for error. Testing must be finite and flawless. GEN3 understand the need for precision. Get closer to perfection by minimising your risk. 

GEN3. Precision as Standard.

For more information, please visit our various platforms;

Website: https://www.gen3systems.com/

LinkedIn: https://www.linkedin.com/company/586317/

Twitter: @Gen3Systems

YouTube: https://www.youtube.com/user/Gen3Systems?ob=0

Mar 11, 2024 -

GEN3 to Demo SIR Testing, Stencil Cleaning & More with Horizon Sales at APEX

Feb 05, 2024 -

GEN3 to Showcase Advanced Inspection and Testing Solutions at the Southern Manufacturing & Electronics Expo

Jan 15, 2024 -

Gen3 to Release Next Generation CM Series Contaminometer in Q1 2024

Oct 09, 2023 -

Gen3 Appoints John Barraclough as Head of Business Development Following Retirement of Nick Redgrave-Plumb

Sep 04, 2023 -

Gen3 to Showcase Cutting-Edge Test Solutions at Productronica India 2023

Sep 04, 2023 -

Gen3 to Exhibit at the 24th European Microelectronics & Packaging Conference

Aug 21, 2023 -

Unlock the Future of Electronics Manufacturing: Gen3 and Zestron Workshop

Jun 19, 2023 -

Gen3 Welcomes Daniel Ryland as New Area Technical Manager for the Southern Region

May 30, 2023 -

Gen3 Launches "The Printed Circuit Assembler's Guide to...™ Process Control" eBook in Collaboration with i-Connect007

May 15, 2023 -

CIL Upgrades Facility with Ionic Contamination Testing & PCB Cleaning Systems from Gen3

51 more news from Gen3 Systems »

Mar 27, 2024 -

Red Glue SMT Solutions: A Cost-Effective Approach for Double-Sided PCBs

Mar 26, 2024 -

North American PCB Industry Sales Down 11.6 Percent in February

Mar 26, 2024 -

iNEMI/IPC White Paper on Complex Integrated Systems Highlights Future Technology and Manufacturing Ecosystem Needs

Mar 26, 2024 -

Don Dennison Appointed to Roll Out KIC's Latest Thermal Analysis System Software in the Northeast

Mar 26, 2024 -

Altus Group Achieves Record Sales Milestone with Koh Young Europe

Mar 26, 2024 -

STI Welcomes Edrick Young as the Newest Mechanical Assembly Technician

Mar 26, 2024 -

Anda Technologies Receives 2024 NPI Award for Setting a New Standard in Smart Manufacturing

Mar 26, 2024 -

ZESTRON's Olaf Schoenfeld, Ph.D. to Participate in EV Special Session at IPC APEX Expo

Mar 26, 2024 -

North American EMS Industry Up 4.1 Percent in February

Mar 26, 2024 -

SMTA Europe Announces 2024 Spring Conferences

See electronics manufacturing industry news »

Gen3's Dr Chris Hunt, CTO to Present at SMTA Electronics in Harsh Environments Conference news release has been viewed 470 times

  • SMTnet
  • »
  • Industry News
  • »
  • Gen3's Dr Chris Hunt, CTO to Present at SMTA Electronics in Harsh Environments Conference
Manufacturing Software

SMT spare parts - Qinyi Electronics