SMT, PCB Electronics Industry News

TRI Receives Global Technology Award

Oct 04, 2020

Test Research, Inc. announces that the company's 3D AXI system, TR7600F3D SII, received a 2020 Global Technology Award. 

The TR7600F3D SII is built on a new and more robust mechanical platform design that achieves a higher speed up to 10 FOV/s, twice as fast as the previous model. Moreover, it is also able to inspect large PCB sizes, up to 900 x 460 mm, being a perfect fit for multiple industries and applications. The TR7600F3D SII's high quality is manifested in minimal maintenance and high-reliability inspection.

The AXI platform eases maintenance with the Smart Monitoring function, including auto-calibration and key component health monitoring, to ensure issue traceability. The Big Data Ready solution enables data exchange with MES applications, improving the yield rate and traceability.

Test Research, Inc. (TRI) provides the most cost-effective solutions to meet a comprehensive range of manufacturing test and inspection requirements, from Automatic Test and Inspection solutions to Manufacturing Defect Analyzers, In-Circuit Testers, and Functional Testers. Learn more at For sales and service information, please write to us at call +886-2-2832 8918.

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