Used SMT Equipment | In-Circuit Testers
Notes: This system has been kept in a clean room lab. Usage is extremely low, as it was for demo purposes only. Details: * 4020 M; High Speed; Manual Loading; 4 Probes; * Internal Graphic printer; 24
Used SMT Equipment | In-Circuit Testers
Description Make: Takaya Model: APT-9411CE Year: 2010 Type: Flying Probe Details: Takaya APT 9411 CE Flying Probe The APT-9411CE is designed for users who are looking for a precise and reliable test system with an easy to use softwar
Used SMT Equipment | In-Circuit Testers
2005 Seica FPT Pilot 1 Flying Prober The Seica FPT Pilot 1 is part of Seica’s range of flying probe test systems, designed for testing electronic boards. These systems are known for their flexibility, precision, and efficiency. Here are some key feat
Used SMT Equipment | In-Circuit Testers
Looking for Flying probe tester, prefer this model, but can accept other also.
Used SMT Equipment | In-Circuit Testers
Seica Flying Probe Test System Model: S40FP Pilot LX Year: 2006 Complete & Operational
Used SMT Equipment | In-Circuit Testers
[WANTED] SPEA Flying Probe Preferred Model: 4060S2 Complete & Operational Units Immediate Need & Ready To Buy
Used SMT Equipment | In-Circuit Testers
Seica S40 Pilot Flying Probe Tester Equipment Description Seica Model Number: S40 Pilot Serial Number: 156 4 Top side Flying Probes 8 Bottom side - 1024 analog channels or 512 progammble Window Operating System Test Speeds 12-20 test/s Tes
Used SMT Equipment | General Purpose Test & Measurement
Hello we are looking for the following machines Takaya flying probe machines APT 820s,9411 and 9600. If you have available please send me spec set up, software, location,price wanted Thanks Robi
Used SMT Equipment | In-Circuit Testers
Operating system: Windows 7 Software: Leonardo 2.3 XA Details: • 4040 Multimode SBL; STD Speed; High Accuracy ; 500x400mm (20x16") • Board locking system with PCB height compensator for SBL 100 • Automatic Tester Interface for SBL predisposed f
Events Calendar | Thu Aug 15 00:00:00 EDT 2024 - Thu Aug 15 00:00:00 EDT 2024 | Duluth, Georgia USA
Atlanta Chapter In-Person Technical Meeting: State-of-the-Art Test Techniques
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