Wafer-level Product In-line(Ireland) 2D, 3D CT AXI Machine Automatic inspection equipment exclusively for the Wafer-level products and ultra-fine defects of mm can be detected using the Nano Tube of Class Focal spot 200nm. 2D, as well as 70&o
New Equipment | Test Equipment
81989A Main features Wavelength range 1505 to 1630 nm Scanning wavelength accuracy ±10 pm Maximum scanning speed 200 nm/s Repetition rate of more than 2 times/sec for bidirectional scanning Built-in correlation control, stimulated Brillouin sca
High-precision, ultra-high resolution high-end 2D, 3D CT X-ray examination equipment With the Focal spot 200nm-class tube developed by SEC, ultra-fine defects can be detected at least 1mm and high-precision tests can be performed with system precisi
Industry News | 2011-05-27 21:57:47.0
Traqu is a high-resolution digital 3-D inspection device from Essemtec used for 3-D measurement and analysis in processes such as solder paste inspection (SPI). Measurement tasks are programmed with a few mouse clicks, and DXF and Gerber data can be imported.
Industry News | 2019-12-16 22:05:41.0
In recent years, as a subdivision of the LED industry, UV LED industry has developed in full swing. In 2019, the UV LED industry is in the buffer phase of application explosion, and the most urgent task for relevant companies is to launch the technology war, in order to capture as many places as possible before the real market explosion.
Electronics Forum | Tue Oct 26 11:01:54 EDT 2004 | Simon UK
DO you have an xray onsite? One suggestion is to check what you can with that machine, i know it wont be able to magnify to 200nm or something, but it will show any ESD damage to the wire bonds or any major cracks of the silicon die. P.s. Most devi
