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Material Aging Test-UV Weathering Test Chamber

Technical Library | 2019-11-15 02:20:26.0

Material Aging Test-UV Weathering Test Chamber 1.What is UV aging? UV aging chambers use fluorescent ultraviolet lamp as light source to simulate UV radiation and condensation in natural sunlight, and to carry out accelerated weather resistance test in order to obtain the result of weather resistance of the material. UV aging detection is widely used in non-metallic materials, organic materials (such as coatings, paints, rubber, plastics and their products) under the change of sunlight, humidity, temperature, condensation and other climatic conditions to test the aging degree and situation of related products and materials. 2.Why we should do UV aging test? When the product is placed in the ambient environment, there will be different problems taken place, such as appearance changes, including cracking, speckle, powdering or color change, and even performance degradation,which may be due to the loss of components in the resin resulting in chemical bonds changes inside the molecular structure, this is mainly caused by sunlight, industrial exclusion of waste gas, bacteria and so on. The aging performance of the product directly affects the lifespan of the product, so aging test become significant,non-metallic materials, organic materials (such as paints, paints, rubber, plastics and their products) are subject to changes in sunlight, humidity, temperature, condensation and other climatic conditions to test the degree and condition of aging of related products and materials. The natural aging test is to put the plastic specimen under the sun exposure, and it is directly under the natural climate environment,to test the material performance under various factors such as light, heat energy, atmospheric humidity, oxygen and ozone, industrial pollution and the like, the most harsh climate condition should be selected,or near the actual application area of the material, the test site shall be open and flat, no obstacle to affect the test results,the specimen holder shall be facing the equator and at an angle of 45 ° from the ground. When the main performance index of the specimen has been reduced, the test s/b terminated when it achieve the minimum allowable use value . in most case,the test is terminated when the product primary performance index falls to 50% of the initial value. The natural aging process is a very slow process, and there is a great difference in different geographical conditions, which brings difficulties to evaluate the aging resistance of the product. It is an attempt to make an evaluation of the aging performance of the plastic in a shorter time,that is accelerated aging test. The accelerated aging test can be used to simulate the human light source of the fluorescent lamp, including the carbon arc lamp, the xenon arc lamp and the fluorescent ultraviolet lamp, and the artificial light sources can generate more light than the natural sunlight on the ground. When these artificial light sources are used, it is also common to use the combination of the condenser to simulate the rain drop, the dew and the like to conduct the aging test on the product.

Symor Instrument Equipment Co.,Ltd

Technical Devices NuEra 18

Technical Devices NuEra 18

Used SMT Equipment | Soldering - Wave

18" Wave Solder Machine New 2014. Lead Free Process Ready Solder Pot;  “Dancer” and Laminar Wave Nozzles; P.I.D. Temperature Control; Low Dross Formation;1000 lb. Solder Capacity. PREHEATER MODULE 2 each 3 foot long Zones; Forc

Petlock Incorporated

YSC HD801 HD 1080p Digital Microscope

YSC HD801 HD 1080p Digital Microscope

New Equipment | Inspection

5x-112x or 10x -224x The HD801 is the ultimate digital microscope with a 22” Samsung HD monitor and using the most advanced high definition digital camera technology to deliver full 1080p resolution in HD quality and full motion video with no lag t

YSC Technologies

Guideline for wire bonding

Industry News | 2019-11-05 22:19:03.0

> News-Blog > Guideline for wire bonding Guideline for wire bonding Tuesday,Jun 12,2018 There are two wire bonding processes that are used, Thermosonic (T/S) Gold Ball Wire Bonding and Ultrasonic (U/S) Aluminum Wedge Wire Bonding. Approximately 90% of all IC Assembly in Semiconductor Packages is manufactured using Gold Ball Bonding process, while Aluminum Wedge Bonding is used to produce about 10% of other Wire Bonding requirements on Printed Circuit Boards (PCB), Printed Circuit Flex (PCF) and other Packages.

Headpcb

Zhuomao ZM-R6821

Zhuomao ZM-R6821

Videos

1.The top heater can move freely along the X, Y axis in the IR preheating area It is good for many BGA chips distribution at different positions in the PCB board which need repair X-shaped infrared laser can do rapid location After location the elect

Shenzhen Zhuomao Technology Co., Ltd

USI Prism 400 BT Ultra Coat

USI Prism 400 BT Ultra Coat

Used SMT Equipment | Coating and Encapsulation

2018 Ultrasonic Systems Inc. (USI) Model: Prism 400 BT Thin Coat Film Applicator * 220VAC Single Phase Power * Dry Shop Air required. * Exhaust 100 CFM @ .2 In WC *Software Version 4.1.9.0 * Windows 7 O/S * Like new condition - appears ma

Assured Technical Service LLC

Opti-Print 2430 BAM - Semi-Automatic Stencil Printer

Opti-Print 2430 BAM - Semi-Automatic Stencil Printer

New Equipment | Printing

Stand alone Semi-Automatic Stencil Printers that offer extra large printing areas. Ideal for backpanels and backplanes and all fine pitch applications. 24" x 30" print area Available Universal Magnetic Tooling PLC based operating syste

Surface Mount Techniques

YSC HD803 HD 1080p Digital Microscope

YSC HD803 HD 1080p Digital Microscope

New Equipment | Inspection

The YSC HD803 is the ultimate 3D rotational viewing digital microscope using the most advanced high definition digital camera technology to deliver full 1080p resolution in HD quality and full motion video at 60 frames per second with no lag time on

YSC Technologies

Solder Joint Reliability of Pb-free Sn-Ag-Cu Ball Grid Array (BGA) Components in Sn-Pb Assembly Process

Technical Library | 2020-10-27 02:07:31.0

For companies that choose to take the Pb-free exemption under the European Union's RoHS Directive and continue to manufacture tin-lead (Sn-Pb) electronic products, there is a growing concern about the lack of Sn-Pb ball grid array (BGA) components. Many companies are compelled to use the Pb-free Sn-Ag-Cu (SAC) BGA components in a Sn-Pb process, for which the assembly process and solder joint reliability have not yet been fully characterized. A careful experimental investigation was undertaken to evaluate the reliability of solder joints of SAC BGA components formed using Sn-Pb solder paste. This evaluation specifically looked at the impact of package size, solder ball volume, printed circuit board (PCB) surface finish, time above liquidus and peak temperature on reliability. Four different BGA package sizes (ranging from 8 to 45 mm2) were selected with ball-to-ball pitch size ranging from 0.5mm to 1.27mm. Two different PCB finishes were used: electroless nickel immersion gold (ENIG) and organic solderability preservative (OSP) on copper. Four different profiles were developed with the maximum peak temperatures of 210oC and 215oC and time above liquidus ranging from 60 to 120 seconds using Sn-Pb paste. One profile was generated for a lead-free control. A total of 60 boards were assembled. Some of the boards were subjected to an as assembled analysis while others were subjected to an accelerated thermal cycling (ATC) test in the temperature range of -40oC to 125oC for a maximum of 3500 cycles in accordance with IPC 9701A standard. Weibull plots were created and failure analysis performed. Analysis of as-assembled solder joints revealed that for a time above liquidus of 120 seconds and below, the degree of mixing between the BGA SAC ball alloy and the Sn-Pb solder paste was less than 100 percent for packages with a ball pitch of 0.8mm or greater. Depending on package size, the peak reflow temperature was observed to have a significant impact on the solder joint microstructural homogeneity. The influence of reflow process parameters on solder joint reliability was clearly manifested in the Weibull plots. This paper provides a discussion of the impact of various profiles' characteristics on the extent of mixing between SAC and Sn-Pb solder alloys and the associated thermal cyclic fatigue performance.

Sanmina-SCI

Agilent / HP 85107B Network Analyzer System, 50 GHz - 8510C

Agilent / HP 85107B Network Analyzer System, 50 GHz - 8510C

New Equipment | Test Equipment

The Agilent 85107B microwave vector network analyzer is a complete system configured with an Agilent 8510C vector network analyzer, a 50 GHz S-parameter test set, a 50 GHz synthesized sweeper, and 2.4 mm measurement accessories. Option 005 adds step

Recon Test Equipment Inc.


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