The US-Asia Marketplace for Electronic and Semiconductor Components
Industry Directory | Consultant / Service Provider
EDA-US, Inc. is a one stop shop for your design needs. From schematic capture to prototype development, EDA-US looks forward to working with you. For a quote or more information please email sales@eda-inc.us
ProntoVIEW-MARKUP is assembly CAD Viewer & Gerber Viewer software used by electronics manufacturers to quickly find components, pin, shorts between traces, etc. ProntoVIEW-MARKUP is also a redline tool that allows annotation of the assembly to creat
New Equipment | Industrial Automation
SANDY.[MAILTO:UNITY@MVME.CN] SANDY.[WHATSAPP/SKYPE/MOBILE:+8618020776786] SANDY.[QUOTE TO YOU WITHIN THE SHORTEST POSSIBLE TIME WITH OUR BEST PRICE] WARRANTY: UP TO 12 MONTHS SHIPPING: FAST DELIVERY IS AVAILABLE NEW+ORIGINAL+IN STOCK+ONE YE
Electronics Forum | Sun Aug 30 15:32:33 EDT 2009 | jimmyboz
most fuji error codes are 8 digits, A21E is 2100A21E, it is a report from the MCS that transmission has failed (we knew that) Hit control E from the main screen of the MCS, there should be another error reported from the cp6, ie. 1101000 is x data ou
Electronics Forum | Sat Jan 01 09:03:18 EST 2022 | sarason
Faulty memory?
Used SMT Equipment | Screen Printers
DEK 03iX Specs: • Process alignment capability 2 Cpk @ ± 25µm 6-Sigma • Machine alignment capability 2 Cpk @ ± 12.5µm 6-Sigma • 12 second cycle time • High Throughput Conveyor (option) , enables core cycle time reduction to just 11 seconds • DE
Used SMT Equipment | In-Circuit Testers
Anritsu S331E Anritsu S331E Sitemaster - Anritsu is pleased to introduce its eighth-generation compact handheld Site Master cable and antenna analyzer series with integrated spectrum analyzer. The new Site Master analyzers offer the same ease of
Industry News | 2003-03-27 08:15:33.0
Modular Embedded Circuit Board from parvus Enables Local Device Fingerprint Biometrics
Industry News | 2003-02-04 08:49:40.0
John Was the Product Manager for Orcad's Schematic Capture and PCB Layout Programs from 1994 to 2001
Parts & Supplies | Pick and Place/Feeders
The electric double tape feeder holds two 8mm reels in the space(17mm) of a single traditional tape feeder. This doubles the feeder capacity of the machine which means there is a greater chance of clustering boards into a single feeder setup. It also
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
ML-2500S PCB Separator uses high speed rotation milling cutter to separate PCB array. Widely applied in digital, communication, lighting, etc. Which improved the defect on PCB separating caused by manual, V-cut, stamping, etc If you have any questi
telescopic lifting conveyor /gateway telescopic conveyor/PCB conveyor, https://www.ascen.ltd/Products/Automatic_SMT_equipment/PCB_conveyor/1PCB Telescopic lifting conveyor is used to make passage in the PCB intelligent assembly line to give the opera
Training Courses | | | PCB Inspection Courses
The PCB inspection courses focus on improving PCB yield and reliability through validation and detection of defects on electronics assemblies.
Career Center | new delhi, India | Engineering,Technical Support
Dear Sir/Madam, I would like to take this opportunity of introducing myself to you. I am Software Developer. Presently I am working with Autometers Alliance Ltd. and looking for a better option that gives me a platform where I can utilize my techni
Career Center | Bangalore, Karnataka India | Maintenance,Management,Production,Purchasing,Technical Support
Having 6+ years of experience in Production Process, Production Assembly,AOI, Reflow profiling and Product costing. At present working for Navsemi Technologies as an Production Lead.
SMTnet Express, June 17, 2021, Subscribers: 27,013, Companies: 11,386, Users: 26,712 Dispensing EMI Shielding Materials: An Alternative to Sputtering Shielding electronic systems against electromagnetic interference (EMI) has become
| https://www.smtfactory.com/ic-programming-system.html
& Events As a global intelligent equipment provider, I.C.T has continued to provide intelligent electronic equipment for global customers since 2012
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. Contact the knowledgeable professionals at EPTAC to enroll in a certification course at a training center near you, today! About EPTAC For over 30 years, EPTAC has been a leading provider of solder training and IPC certification