Full Site - : agilent and 8069 (Page 10 of 17)

Agilent Technologies' VEE 8.5 Offers Enhanced Programming Environment and Support for Windows Vista(TM)

Industry News | 2007-10-23 02:23:25.0

Agilent Technologies Inc. (NYSE: A) today introduced the enhanced version of the Agilent VEE 8.5 graphical programming software for test and measurement, equipping users with more functions and support for the latest software tools and operating systems in the industry, including Windows Vista.

Agilent Technologies, Inc.

Acculogic and Electro Tech Sales to Hold Testing Seminar

Industry News | 2010-01-22 20:47:53.0

WOBURN, MA ? January 2010 ? Acculogic’s Manufacturing Test Systems Division, a global leader in electronics test and production solutions, announces that Bob Steel, North American Sales Manager, and Greg Leblonc, Application and Flying Probe Product Manager, will hold a seminar on advances in limited access testing.

Acculogic Inc.

Acculogic and MEO to Hold Testing Seminars in Ohio

Industry News | 2010-01-22 20:51:30.0

WOBURN, MA ? January 2010 ? Acculogic’s Manufacturing Test Systems Division, a global leader in electronics test and production solutions, announces that Bob Steel, North American Sales Manager, and Greg Leblonc, Application and Flying Probe Product Manager, will hold two seminars on advances in limited access testing.

Acculogic Inc.

ASSET aligns company, technology and products with embedded instrumentation

Industry News | 2008-05-15 23:05:35.0

RICHARDSON, Texas (May 14, 2008) - Responding to the increasing momentum in the electronics industry toward embedded instrumentation, ASSETR InterTech, Inc. (www.asset-intertech.com) announced it is positioning the company, its products and its technologies to provide open tools for embedded instrumentation in design validation, test and debug applications.

ASSET InterTech, Inc.

Agilent Technologies and Zollner Announce Selection of Agilent Medalist x6000 Automated X-Ray Inspection System by Zollner

Industry News | 2008-04-22 20:35:20.0

Agilent Technologies Inc. (NYSE: A) and the Zollner Group today announced that Zollner, a global electronics manufacturing services provider, has selected the Agilent Medalist x6000 Automated X-ray Inspection (AXI) system to enhance its test and inspection capabilities.

Agilent Technologies, Inc.

Agilent Technologies Releases a Comprehensive RF and Microwave Switch Selection Guide

Industry News | 2008-07-19 15:46:16.0

Agilent's new "RF and Microwave Switch Selection Guide" provides comprehensive information on Agilent's entire portfolio of switches, which is comprised of both electromechanical and solid state switches. Packed with information, this guide provides you with all the technical information you need to select the right switch for your application.

Agilent Technologies, Inc.

Agilent Technologies and Multiprobe to Bring World's Highest-Resolution Nanoprober to Asia

Industry News | 2007-12-05 23:47:40.0

SANTA CLARA, Calif., Dec. 3, 2007 -- Agilent Technologies Inc. (NYSE: A) and Multiprobe Inc. today announced their intent to expand the companies' strategic partnership. As a result, Multiprobe's Multiscan Atomic Force Prober (AFP), the world's highest-resolution nanoprober, will be sold and supported by Agilent to customers in Asia and Japan.

Agilent Technologies, Inc.

Agilent Technologies and Zollner Announce Selection of Agilent Medalist x6000 Automated X-Ray Inspection System by Zollner

Industry News | 2008-04-24 14:44:27.0

Agilent Technologies Inc. (NYSE: A) and the Zollner Group today announced that Zollner, a global electronics manufacturing services provider, has selected the Agilent Medalist x6000 Automated X-ray Inspection (AXI) system to enhance its test and inspection capabilities.

Agilent Technologies, Inc.

Agilent Technologies Introduces Highly Sensitive Imaging Mode for Complex, Calibrated Electrical and Spatial Measurements

Industry News | 2008-07-19 12:33:16.0

Agilent Technologies Inc. (NYSE: A) today announced the availability of scanning microwave microscopy (SMM) mode, a unique imaging technique that combines the comprehensive electrical measurement capabilities of a performance network analyzer (PNA) with the outstanding spatial resolution of an atomic force microscope (AFM).

Agilent Technologies, Inc.


agilent and 8069 searches for Companies, Equipment, Machines, Suppliers & Information