Used SMT Equipment | AOI / Automated Optical Inspection
Agilent SJ50 Series 2 inline AOI on sale. 1.Vintage: 2003 2.Total Unit: 2 Units available. For more details, please contact us.
Used SMT Equipment | AOI / Automated Optical Inspection
Agilent SJ50 AOI machine Year 2007 just offline Immediate sales : customerst@163.com
Industry News | 2008-04-07 23:34:04.0
Agilent Technologies Inc. (NYSE: A) today introduced a new Automated Optical Inspection (AOI) platform that is fully qualified for all areas of surface mount technology (SMT) line inspection, including post-, pre- and 2-D capabilities. Agilent is demonstrating this platform here through April 3.
Used SMT Equipment | AOI / Automated Optical Inspection
Agilent SJ50 Series II XL Available for immediate sales XL size Welcome for details Ricky
Used SMT Equipment | AOI / Automated Optical Inspection
Agilent SJ50+ IBE SMT Inventory ID : 111015-017 Agilent Serial Number : IE41500147 Vintage : 2002 Click Here for more details or to request a quote... IBE SMT Equipment www.ibesmt.com 800-353-6942 - Toll Free 281-259-9660 - Office sales@i
Used SMT Equipment | AOI / Automated Optical Inspection
Agilent SJ50 Series 3 AOI IBE SMT Inventory ID : 160415-010 Agilent Serial Number : SG51500032 Vintage : 2007 Details •200-240 VAC 1-Phase 16A Click Here for more details or to request a quote online... IBE SMT Equipment 281-259-9660 Of
Used SMT Equipment | AOI / Automated Optical Inspection
Agilent SJ50 Series 3 IBE SMT Inventory ID : 160415-002 Agilent Serial Number : SG51500110 Vintage : 2007 Details • 200-240 VAC 1-Phase 16A Click Here for more details or to request a quote online... IBE SMT Equipment 281-259-9660 Offic
Used SMT Equipment | AOI / Automated Optical Inspection
Agilent SJ50 Series 3 IBE SMT Inventory ID : 140210-036 Agilent Serial Number : SG41501000 Vintage : 2006 Details 200-240 VAC 16A Click Here for more details or to request a quote online... IBE SMT Equipment 281-259-9660 Office 800
Industry News | 2010-03-17 19:20:13.0
WOBURN, MA ? Acculogic's Manufacturing Test Systems Division, a global leader in electronics test and production solutions, announces that the advances in limited testing seminar has been changed from Tuesday, March 23 to Tuesday, April 27, 2010. The time and location will remain the same: 8:30-11:30 a.m. at the Crowne Plaza Hotel in Newton, MA. Also, the second seminar, originally scheduled to take place on Wednesday, March 24, 2010 from 8:30-11:30 a.m. at the Hampton Inn in Farmington, CT has been cancelled.
Automated 3D paste inspection for print process characterization, control and early defect prevention Best-in-class shadow free 3D paste measurement from the world’s leader in test and measurement. The Medalist SP50 Series 3 Dual Laser system is th