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LeCroy SBAE-20

LeCroy SBAE-20

Used SMT Equipment | General Purpose Test & Measurement

Catalyst SBAE20 Standalone Bus Analyzer/Exerciser Unit The SBAE20 is a standalone bus Analyzer/Exerciser unit for use with USB 2.0 systems. It is designed for the complex testing and verification required for USB hardware and software system valida

Test Equipment Connection

Agilent 86100A Infiniium DCA Wide-Bandwidth Oscilloscope

Agilent 86100A Infiniium DCA Wide-Bandwidth Oscilloscope

Used SMT Equipment | General Purpose Test & Measurement

Key Features & Specifications Digital Communications Analyzer modes: Oscilloscope with bandwidth in excess of 50 GHz, ensuring the most accurate waveform measurements Eye diagram analyser for transmitter compliance testing Time domain reflect

Shenzhen Zhongce Photoelectric Technology Co., LTD

Agilent 86100C Infiniium DCA-J Wideband Oscilloscope Mainframe

Agilent 86100C Infiniium DCA-J Wideband Oscilloscope Mainframe

Used SMT Equipment | General Purpose Test & Measurement

40 Gb/s Jitter and interference analyzer, measuring subcomponent jitter Time domain reflectometry/transmission (TDR/TDT) for high precision impedance analysis including S-parameters Key features User configurable: mainframe with slots for two

Shenzhen Zhongce Photoelectric Technology Co., LTD

Agilent Technologies Presents Web Seminar Advanced Validation and Testing of

Industry News | 2008-05-03 17:15:32.0

PCI Express brought about a whole new series of challenges for designers and the next generation. PCI Express 2.0 takes the challenges to a new level. Doubling the speed of the link to 5 GT/s, while maintaining backwards compatibility with PCI Express 1.0 potentially opens up interoperability issues. This presentation describes the methods and tools required to validate PCI Express 2.0 designs.

Agilent Technologies, Inc.

Agilent Agilent E8257D-520-1E1

Agilent Agilent E8257D-520-1E1

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521.     Industry’s best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation     AM, FM, øM, pulse, and scan     Typical 6 ns rise/fall times and 20 ns pulse width     Dua

Test Equipment Connection

Agilent Agilent E8257D-520-1E1

Agilent Agilent E8257D-520-1E1

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521.     Industry’s best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation     AM, FM, øM, pulse, and scan     Typical 6 ns rise/fall times and 20 ns pulse width     Dua

Test Equipment Connection

Agilent E8663D

Agilent E8663D

Used SMT Equipment | In-Circuit Testers

Agilent E8663D PSG RF Analog Signal Generator, up to 9 GHz The Agilent E8663D PSG is a fully synthesized signal generator with high output power, low phase noise, and optional ramp sweep capability. Features: Signal characteristics- • 100 k

Test Equipment Connection

Agilent E8257D-520-1E1

Agilent E8257D-520-1E1

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521.     Industry’s best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation     AM, FM, øM, pulse, and scan     Typical 6 ns rise/fall times and 20 ns pulse width     Dua

Test Equipment Connection

Agilent E8257D-520

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521.     Industry's best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation     AM, FM, 0M, pulse, and scan     Typical 6 ns rise/fall times and 20 ns pulse width     Dua

Test Equipment Connection

Agilent E8257D-520

Agilent E8257D-520

Used SMT Equipment | In-Circuit Testers

+30 dBm (typ) with Option 521. Industry's best SSB phase noise with Option UNY: -143 dBc/Hz (typ) for a 1 GHz signal at 10 kHz offset Modulation AM, FM, 0M, pulse, and scan Typical 6 ns rise/fall times and 20 ns pulse width Dual internal functio

Test Equipment Connection


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