Full Site - : bondability of gold (Page 7 of 18)

StenTech Celebrates 25 Years of Excellence in Innovative SMT Stencils, Tooling, and Parts Solutions

Industry News | 2024-01-02 15:49:05.0

StenTech® Inc. proudly announces its 25th anniversary. For a quarter of a century, StenTech has been at the forefront of the Surface Mount Technology (SMT) industry, revolutionizing the manufacturing process with innovative stencil, tooling and parts solutions that empower customer success.

Stentech

Concept 2 Market, Inc. Announces Implementation of Aegis Manufacturing Operations Software

Industry News | 2011-05-19 22:54:11.0

The recently completed implementation of Aegis Manufacturing Operations Software allows Concept 2 Market, Inc. (C2M) to improve efficiencies and quality by streamlining and controlling process planning and launch, process tracking and control, and quality and test management.

Concept 2 Market, Inc.

Krayden Named Distributor of the Year for Electronics in 2013 North America

Industry News | 2014-05-05 17:21:00.0

Denver-April 2014-Dow Corning has named Krayden, Inc. (http://Krayden.com) as the recipient of the “Dow Corning Electronics North American Distributor of the Year 2013” for its outstanding performance in the distribution of engineered silicone materials in electronics. Krayden has been honored with this coveted and prestigious award five out of the last seven years.

Krayden Inc.

Cost Analysis of Printed Circuit Boards

Technical Library | 2004-05-23 17:18:26.0

This is an article written by our company's experts to help our customers to make informed decision on PC boards purchasing. It introduces the materials that are used in the PCB manufacturing and the cost analysis of different materials.

Gold Phoenix PCB Co, Ltd

Gen3 Systems announces an entirely new design of the CM Series at productronica

Industry News | 2015-10-21 20:30:02.0

Gen3 Systems Limited is pleased to introduce a totally new design of the Contaminometer (CM Series Process Ionic Contamination Testers) it will be released in Hall A4, Booth 470 at the productronica International Trade Fair, scheduled to take place Nov. 10-13, 2015 at the Messe München exhibition center in Munich, Germany. Gen3 will be exhibiting alongside its German Distributor, Stannol GmbH.

Gen3 Systems

Study of Various PCBA Surface Finishes

Technical Library | 2015-11-25 14:15:12.0

In this study various printed circuit board surface finishes were evaluated, including: organic solderability preservative (OSP), plasma finish (PF), immersion silver (IAg), electroless nickel / immersion silver (ENIS), electroless nickel / immersion gold hi-phosphorus (ENIG Hi-P), and electroless nickel / electroless palladium / immersion gold (ENEPIG). To verify the performance of PF as a post-treatment option, it was added to IAg, ENIG Hi-P, and ENEPIG to compare with non-treated. A total of nine groups of PCB were evaluated. Each group contains 30 boards, with the exception on ENIS where only 8 boards were available.

Flex (Flextronics International)

Identification and Prevention of "Black Pad"

Technical Library | 2013-01-17 15:34:33.0

The use of an electroless nickel, immersion gold (ENIG) surface finish comes with the inherent potential risk of Black Pad failures that can cause fracture embrittlement at the interface between the solder and the metal pad. As yet, there is no conclusive agreed solution to effectively eliminate Black Pad failures. The case studies presented are intended to add to the understanding of the Black Pad failure mechanism and to identify both the plating and the subsequent assembly processes and conditions that can help to prevent the likelihood of Black Pad occurring.

Jabil Circuit, Inc.

Dissolution of Metal Foils in Common Beverages

Technical Library | 2016-07-07 15:37:18.0

How susceptible are the metals used in modern electronics manufacturing to corrosion by common beverages? This is a question of interest, especially to manufacturers, retailers and to a certain extent end customers. In this study the dissolution of aluminum, copper, gold, iron, lead, nickel, SAC305 solder, silver, tin and zinc was examined. Individual foils of these materials were fully immersed in one of sixteen chosen beverages and heated for 3 days at 40°C. The resulting solutions were analyzed using ICP-OES. The data were examined in light of the known pH, conductivity and ionic contents of the beverages, determined in previous work. Conclusions about the relative susceptibility to corrosion of the various metals and the corrosive power of the different beverages are made.

BlackBerry Limited

Effect of Gold Content on the Microstructural Evolution of SAC305 Solder Joints Under Isothermal Aging

Technical Library | 2013-08-29 19:52:43.0

Au over Ni on Cu is a widely used printed circuit board (PCB) surface finish, under bump metallization (UBM), and component lead metallization. It is generally accepted that less than 3 wt.% Au in Sn-Pb solder joints inhibits formation of detrimental intermetallic compounds (IMC). However, the critical limit for Au content in Pb-free solder joints is not well established. Three surface-mount package platforms, one with a matte Sn surface finish and the others with Ni/Au finish, were soldered to Ni/Au-finished PCB using Sn-3.0Ag 0.5Cu (SAC305) solder, in a realistic manufacturing setting. The assembled boards were divided into three groups: one without any thermal treatment, one subjected to isothermal aging at 125°C for 30 days, and the third group aged at 125°C for 56 days...

Agilent Technologies, Inc.

Influence of Pd Thickness on Micro Void Formation of Solder Joints in ENEPIG Surface Finish

Technical Library | 2012-12-13 21:20:05.0

First published in the 2012 IPC APEX EXPO technical conference proceedings. We investigated the micro-void formation of solder joints after reliability tests such as preconditioning (precon) and thermal cycle (TC) by varying the thickness of Palladium (Pd) in Electroless Nickel / Electroless Palladium / Immersion Gold (ENEPIG) surface finish. We used lead-free solder of Sn-1.2Ag-0.5Cu-Ni (LF35). We found multiple micro-voids of less than 10 µm line up within or above the intermetallic compound (IMC) layer. The number of micro-voids increased with the palladium (Pd) layer thickness. Our results revealed that the micro-void formation should be related to (Pd, Ni)Sn4 phase resulted from thick Pd layer. We propose that micro-voids may form due to either entrapping of volatile gas by (Pd, Ni)Sn4 or creeping of (Pd, Ni)Sn4.

Samsung Electro-Mechanics


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