Technical Library | 2022-10-04 16:43:10.0
In this paper I will discuss the different methods and equipment used to detect counterfeit electronic parts, specifically integrated circuits as well as demonstrate some of the "red flags" that help to identify a part as being suspected counterfeit. We will begin with the initial receipt of the parts and the examination of the outer packaging, the basic visual inspection of the parts, the visual inspection and documentation at high magnification, permanency marking, blacktop test, scrape test, XRF (RoHS), decapsulation, X-ray, basic electrical testing, C-SAM, full function testing and limited function testing.
Industry Directory | Consultant / Service Provider / Manufacturer / Manufacturer's Representative / Other
Semiconductor and SMT equipments sales new and used. Includes FA lab equipment Test, FIB, SEM, EDX,, C-SAM, inspection and probers
Industry Directory | Research Institute / Laboratory / School
MUAnalysis is an independent lab for Component Failure Analysis and Reliability Testing in Ottawa, Ontario Canada. We also would be pleased to discuss your analysis needs. We also perform all non-destructive testing ...
Failure analysis - Components as well as PC boards, Discretes, Passives ICs - offering X-ray. SEM/EDX -XRF - Cross sectioning complete root cause F/A
New Equipment | Test Equipment
New in 2015! Datest now offers the following services: Scanning Acoustic Microscopy (C-SAM) Analysis X-ray Fluorescence (XRF) Scanning Electron Microscopy (SEM) Fourier Transform Infrared Spectroscopy (FTIR) Analysis Energy Dispersive X-ra
Career Center | Corpus Christ, Texas USA | Engineering,Quality Control
This position reports to the Quality Manager and provides support in all areas of fabrication and assembly of passive components exceeding customer requirements and expectations in a fast paced environment. Support is defined as but not limited to th
Industry Directory | Consultant / Service Provider / Manufacturer
Designer & Manufacturer of Acoustic Microscopes for Nondestructive Component Inspection.
FACTS²™ DF2400™ C‑SAM® Automated In-line Inspection Tool for Defect-Free Production Without Sacrificing Throughput The FACTS²™ delivers state-of-the-art, automated in-line inspection for quality and process control. Delivering high throughput wit
Industry News | 2017-09-26 18:57:51.0
Datest will exhibit at the Northwest Electronics Design and Manufacturing Expo (NEDME, a.k.a. OctoberBest), scheduled to take place Wednesday, Oct. 4, 2017 at Tektronix in Beaverton, OR. Robert Boguski and Regina Lathrop from Datest will discuss the company’s testing, engineering and PCB reverse engineering services, and value-added services including:
Industry News | 2017-11-14 17:58:13.0
Datest today announced plans to exhibit at the SMTA Silicon Valley Expo & Tech Forum, scheduled to take place Wednesday, Nov. 29, 2017 at Bestronics, Inc. in San Jose, CA. The event is free to attend and includes a complimentary lunch. For more information or to register for the event, visit https://www.smta.org/expos/attendee_reg.cfm?event_id=1406.
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