Full Site - : ct scan xray damage to electronics (Page 5 of 21)

ASC International to Demonstrate SAKI AOI at SMTA International

Industry News | 2012-10-10 17:45:02.0

ASC International, have entered into an agreement that will focus on sales and service of SAKI’s 2D & 3D AOI and X-ray product line in the North American market.

ASC International

Robert Boguski to Chair Session at SMTAI: “The Roadmap and the Reaction: Challenges and Responses in Advanced Assembly Technology”

Industry News | 2017-09-05 16:09:04.0

Datest today announced that its President Robert Boguski will Chair Session TI Keynote & TI3 during SMTA International. The session, entitled, “The Roadmap and the Reaction: Challenges and Responses in Advanced Assembly Technology,” is scheduled to take place Monday, Sept. 18, 2017 from 12:30 – 3 p.m. in Room 48. Speakers for the session include keynote speaker, Bill Bader from iNEMI, John Timmerman, Ph.D. from Henkel and Luis Carlos Montemayor from Dow Corning Corporation.

Datest

optical control Launches Americas division in Response to Rapid Growth

Industry News | 2018-09-05 20:36:01.0

optical control today announced the motivation behind opening their USA division was in response to the rapid growth. Globally, the company is up 250% over 2017 and it’s only September, and expected to be well over 300% by the end of 2018. The official launching date for Optical Control Americas, LP is early October.

optical control GmbH & Co. KG

TRI brings AI-powered Inspection to IPC APEX EXPO 2022

Industry News | 2021-12-17 16:43:01.0

Test Research, Inc. (TRI) will join IPC APEX EXPO 2022 held at San Diego Convention Center to showcase its Smart Factory inspection and test solutions for the electronics manufacturing industry. Visit TRI at booth #915 on January 25 – January 27, 2022, to discover TRI's latest Smart Factory innovations that aim to optimize the SMT production through AI-powered Inspection, multiple 3D technologies, metrology inspection, real-time SPC trends, and M2M communications.

TRI - Test Research, Inc. USA

Acculogic and Electro Tech Sales to Hold Testing Seminar

Industry News | 2010-01-22 20:47:53.0

WOBURN, MA ? January 2010 ? Acculogic’s Manufacturing Test Systems Division, a global leader in electronics test and production solutions, announces that Bob Steel, North American Sales Manager, and Greg Leblonc, Application and Flying Probe Product Manager, will hold a seminar on advances in limited access testing.

Acculogic Inc.

Acculogic and MEO to Hold Testing Seminars in Ohio

Industry News | 2010-01-22 20:51:30.0

WOBURN, MA ? January 2010 ? Acculogic’s Manufacturing Test Systems Division, a global leader in electronics test and production solutions, announces that Bob Steel, North American Sales Manager, and Greg Leblonc, Application and Flying Probe Product Manager, will hold two seminars on advances in limited access testing.

Acculogic Inc.

Acculogic to Host Testing Seminars throughout the Southeast United States

Industry News | 2011-02-09 14:09:23.0

Acculogic’s Manufacturing Test Systems Division, a global leader in electronics test and production solutions, announces that it will host several Advances in Limited Access Testing seminars throughout February 2011.

Acculogic Inc.

Datest Partners with Southwest Systems to Represent Its PCBA Testing & Inspection Services

Industry News | 2018-02-21 19:53:45.0

Datest today announced that it has appointed Southwest Systems Technology as its representative throughout Texas, Louisiana, Arkansas and Oklahoma.

Datest

Nordson DAGE to Exhibit World Class µCT Inspection Option at MD&M West 2012

Industry News | 2012-01-17 15:10:25.0

Nordson DAGE will exhibit in Booth #3149 at the upcoming MD&M West Conference and Expo, scheduled to take place February 14-16, 2012 at the Anaheim Convention Center in Anaheim, CA.

Nordson DAGE

Nordson DAGE to Showcase µCT Inspection Option at MD&M East 2012

Industry News | 2012-04-19 10:40:43.0

Nordson DAGE will exhibit in Booth #1201 at the upcoming Medical Design & Manufacturing East Exposition.

Nordson DAGE


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