Industry Directory | Consultant / Service Provider
EDA-US, Inc. is a one stop shop for your design needs. From schematic capture to prototype development, EDA-US looks forward to working with you. For a quote or more information please email sales@eda-inc.us
A universal radio test set for complete maintenance and repair of FM and AM radio stations of the VHF band RST-430 is a multipurpose radio measuring device for maintenance of communication equipment in indoor and field conditions. Functions
A digital combo set. Available in four modifications. A digital combo set for maintenance and repair of carrier channels and data transmission equipment of information structures. Functions Sine-wave generator Broadband rms voltmeter Narro
Electronics Forum | Fri Apr 24 13:55:09 EDT 2015 | duchoang
- Clean nozzles. - Clean camera. - Adjust lighting. - Check tolerance level. Good luck.
Electronics Forum | Mon Apr 27 07:01:01 EDT 2015 | leeg
Is it failing due to Vaccuum level?
Used SMT Equipment | General Purpose Equipment
Year 2008 - Like New Condition Tyco SEP 3T Shuttle Electric Press Standalone electric press for the application of PCBs onto compliant pin housings or connectors • Servo electric press with shuttle system for product location under press ram • Ho
Used SMT Equipment | Pick and Place/Feeders
Qty - 2 Brand New Fuji QP Error Conveyors s/n 1447 x/n 1003 s/n 1434 x/n 998 $250 each or $425 for both
Industry News | 2003-04-01 08:13:08.0
The Introbotics equipment boosts controlled impedance testing productivity and accuracy by a factor of ten compared to the handheld probing techniques.
Industry News | 2003-03-11 08:45:00.0
CAMtastic DXP is the latest version of Altium's complete CAM verification and editing system that bridges the gap between PCB design and manufacturing and facilitates communication between board designers, fabrication engineers, and their clients.
Parts & Supplies | Pick and Place/Feeders
GIC-F01 FUJI NXT Feeder Calibration JIG It is essential for this equipment that enhanced productivity , installation and quality improvement As the high efficiency vision camera is asked in order to investigate precisely and repair the error of
Parts & Supplies | Pick and Place/Feeders
GIC-P01 PANASONIC MSR Feede Calibrtion JIG PANASONIC MSR Feeder Calibration JIG GIC-P01 It is essential for this equipment that enhanced productivity , installation and quality improvement As the high efficiency vision camera is asked in order to
Technical Library | 2015-04-02 20:12:58.0
The demands on volume delivery and positioning accuracy for solder paste deposits are increasing as the size and complexity of circuits continue to develop in the electronics industry. According to the iNEMI 2013 placement accuracy for these kinds of components will reach 6 sigma placement accuracy in X and Y of 30 um by 2023.This study attempts to understand the dependencies on piezo actuation pulse profile on jetting deposit quality, especially focused on positioning, satellites and shape. The correlation of deposit diameter and positioning deviation as a function of piezo actuation profile shows that positioning error for deposits increase almost monotonically with decreasing droplet volume irrespective of the piezo-actuation profile. The trends for shape and satellite levels are not as clear and demand further study.
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
03032873-01 Ultrasonic proximity switch 03033143-02 Main Error Lamp compl.X-Series 03033289-01 Cover plate chort cpl. 2P X 03033628S03 Pick+Place-Modul/THK 03033639-01 DRILLING GAUGE 2 FOR RETROFIT KIT/COVER 03034070-02 Machine
03032873-01 Ultrasonic proximity switch 03033143-02 Main Error Lamp compl.X-Series 03033289-01 Cover plate chort cpl. 2P X 03033628S03 Pick+Place-Modul/THK 03033639-01 DRILLING GAUGE 2 FOR RETROFIT KIT/COVER 03034070-02 Machine Ta
Training Courses | | | PCB Assembly Courses
The PCB assembly courses provide knowledge of different processes and equipment used in TH and SMT assembly of printed circuit boards.
Training Courses | | | PCB Inspection Courses
The PCB inspection courses focus on improving PCB yield and reliability through validation and detection of defects on electronics assemblies.
Events Calendar | Thu Apr 14 00:00:00 EDT 2022 - Thu Apr 14 00:00:00 EDT 2022 | ,
SECS/GEM Automation for OLD/Legacy Semiconductor Capital Equipment
Career Center | Milpitas, California USA | Engineering,Production,Quality Control,Research and Development,Technical Support
Winslow Automation, Inc. (aka Six Sigma), an industry leader in electronic component interconnect technology & related test and failure analysis services, is seeking individuals specializing in materials lab testing to join our team. We have openin
Career Center | rawalpindi, Pakistan | Production
Handling the production line including two SWISS pick and place machines cobra and paraquda ,tucano printer reflow oven ,samsung loader and unloader.Hand on experience with 3D camera inspection system and solder paste height measuring instrument and
Career Center | Fredericksburg, Virginia USA | Engineering,Maintenance,Management,Production,Quality Control
• Certified CP643 Loader Calibration – FUJI American Chicago, IL 2001. • Certified - Cookson Performance Solutions BTU - PARAGON - P150 Oven – Maintenance & Electrical Troubleshooting Charlotte, NC 2001. • Certified UNIVERSAL (GSM) Platform: Operat
GPD Global | https://www.gpd-global.com/co_website/pdf/doc/FLOware-Messages-Reference-Guide-22100026.pdf
FLOware Info and Error Messages Reference Guide Messages Reference Guide Version 1.1 November 28, 2016 Part No. 22100026 for FLOware
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Error 404 - Not Found - EPTAC - Train. Work Smarter. Succeed Looking for solder training standards, manuals, kits, and more? Visit
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