Full Site - : error hardware limit (Page 26 of 96)

Agilent 3457A

Agilent 3457A

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight 3457A Multimeter Agilent 3457AVersatility, functionality, and dependability is packed into this meter! The 3457A Multimeter has seven functions with 3 1/2 to 6 1/2-digits of resolution extendable to 7 1/2-digits at reading rates

Test Equipment Connection

Soft, Wireless Periocular Wearable Electronics For Real-Time Detection Of Eye Vergence In A Virtual Reality Toward Mobile Eye Therapies

Technical Library | 2020-07-22 19:24:33.0

Recent advancements in electronic packaging and image processing techniques have opened the possibility for optics-based portable eye tracking approaches, but technical and safety hurdles limit safe implementation toward wearable applications. Here, we introduce a fully wearable, wireless soft electronic system that offers a portable, highly sensitive tracking of eye movements (vergence) via the combination of skin-conformal sensors and a virtual reality system. Advancement of material processing and printing technologies based on aerosol jet printing enables reliable manufacturing of skin-like sensors, while the flexible hybrid circuit based on elastomer and chip integration allows comfortable integration with a user's head. Analytical and computational study of a data classification algorithm provides a highly accurate tool for real-time detection and classification of ocular motions. In vivo demonstration with 14 human subjects captures the potential of the wearable electronics as a portable therapy system, whose minimized form factor facilitates seamless interplay with traditional wearable hardware.

Georgia Institute of Technology

Soldering and Test Technician

Career Center | Orlando, Florida USA | Production

Position Summary:  Build through-hole (THT) and surface mount (SMT) printed circuit board assemblies, placing components on boards per controlled parts lists, drawing documentation and quality workmanship guidelines. Position reports to:  Group Lea

Volt Workforce Solutions

QC6200 Pulse Width Modulated Four Quadrant Amplifier

QC6200 Pulse Width Modulated Four Quadrant Amplifier

New Equipment |  

The model QC6200 four quadrant amplifier is an economical, low form factor, fast responding, speed and position control. It is designed to control permanent magnet DC motors. The control features full wave rectification and 22KHz PWM for smooth, quie

Quantum Controls

Coreco Imaging Introduces Mamba-100

Industry News | 2001-08-01 16:29:03.0

High Speed Embedded Vision Processor Based on the Pentium III

Coreco Imaging

Agilent 54855A 6 GHz Infiniium Oscilloscope

Agilent 54855A 6 GHz Infiniium Oscilloscope

New Equipment | Test Equipment

The 54855A Infiniium oscilloscope, provides full real-time bandwidth of up to 6 GHz and is supported on every channel by the 20 GSa/s sample rate. This industry-leading sample rate produces more accurate and repeatable measurements, avoiding measurem

Recon Test Equipment Inc.

VisionPro HSi High Speed Offline 3D SPI

VisionPro HSi High Speed Offline 3D SPI

New Equipment | Inspection

VisionPro HSi is high speed, sophisticated 3-dimensional solder paste measurement system coupled with an intuitive Windows® user interface, and packaged in a rugged, bench-top portable system designed for the electronics production floor. With only a

ASC International

VayoPro NPI Software suite

VayoPro NPI Software suite

New Equipment | Software

VayoPro series of NPI Solutions is aimed to streamline the production process and dramatically reduce time to market while improving profitability. Certainly a Vayoble Alternative to DFM & NPI! VayoPro suite of comprehensive NPI Solutions prevents

Vayo America

Creating Reusable Manufacturing Tests for High-Speed I/O with Synthetic Instruments

Technical Library | 2020-07-08 20:05:59.0

There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.

A.T.E. Solutions, Inc.

"Improving Reliability of Continuity and HiPot Testing" | Training Workshop | A Professional Development Course by CAMI Research

Events Calendar | Tue May 16 00:00:00 EDT 2023 - Tue May 16 00:00:00 EDT 2023 | Milwaukee, Wisconsin USA

"Improving Reliability of Continuity and HiPot Testing" | Training Workshop | A Professional Development Course by CAMI Research

CAMI Research Inc.


error hardware limit searches for Companies, Equipment, Machines, Suppliers & Information