Full Site - : fail ionic contamination (Page 4 of 72)

Steel Camel

Industry Directory | Other

Super powerful expanding desiccant to keep boards & microelectronics moisture free.... Much different than Silica Sand Beads. Also supplier of corrosion prevention treatments that are alternatives to Conformal coatings.

Mega™ ION Batch PCB Cleaners

Mega™ ION Batch PCB Cleaners

New Equipment | Cleaning Equipment

World’s First Cleaner & ROSE Tester Removes Fluxes Performs IPC ROSE Test Closed Loop Operation - No Drains Aqueous or Organic Solvents Stainless Steel Construction Automatic Wash/Rinse/Test/Dry 230VAC, 10AMP, 50/60Hz

Austin American Technology

Understanding Creep Corrosion Field Fails

Technical Library | 2022-03-16 19:48:18.0

Dendrites, Electrochemical Migration (ECM) and parasitic leakage, are usually caused by process related contamination. For example, excess flux, poor handling, extraneous solder, fibers, to name a few. One does not normally relate these fails with environmental causes. However, creep corrosion is a mechanism by which electronic products fail in application, primarily related to sulfur pollution present in the air.1 The sulfur reacts with exposed silver, and to a lesser extent, exposed copper. This paper will explore various aspects of the creep corrosion chemical reaction

Foresite Inc.

ASCENTECH to Introduce GEN3 CM+ Systems at IPC/APEX 2016

Industry News | 2016-02-15 13:57:31.0

Ascentech will be introducing the new GEN3 CM+ Systems at IPC/APEX. These systems will be shown for the first time in North America during IPC/APEX. On display in booth #2225 will be the CM22+, one of the award-winning CM+ range of contaminometers from GEN3. This new design is linked to the introduction of the new process control metric introduced by GEN3, e.g., Process Ionic Contamination Testing.

Ascentech LLC

Comparison of ROSE, C3/IC, and SIR as an effective cleanliness verification test for post soldered PCBA

Technical Library | 2023-04-17 21:17:59.0

The purpose of this paper is to evaluate and compare the effectiveness and sensitivity of different cleanliness verification tests for post soldered printed circuit board assemblies (PCBAs) to provide an understanding of current industry practice for ionic contamination detection limits. Design/methodology/approach – PCBAs were subjected to different flux residue cleaning dwell times and cleanliness levels were verified with resistivity of solvent extract, critical cleanliness control (C3) test, and ion chromatography analyses to provide results capable of differentiating different sensitivity levels for each test. Findings – This study provides an understanding of current industry practice for ionic contamination detection using verification tests with different detection sensitivity levels. Some of the available cleanliness monitoring systems, particularly at critical areas of circuitry that are prone to product failure and residue entrapment, may have been overlooked. Research limitations/implications – Only Sn/Pb, clean type flux residue was evaluated. Thus, the current study was not an all encompassing project that is representative of other chemistry-based flux residues. Practical implications – The paper provides a reference that can be used to determine the most suitable and effective verification test for the detection of ionic contamination on PCBAs. Originality/value – Flux residue-related problems have long existed in the industry. The findings presented in this paper give a basic understanding to PCBA manufacturers when they are trying to choose the most suitable and effective verification test for the detection of ionic contamination on their products. Hence, the negative impact of flux residue on the respective product's long-term reliability and performance can be minimized and monitored effectively.

Jabil Circuit, Inc.

Lite Fast 2081

Lite Fast 2081

New Equipment |  

Lite Fast 2081, a UV encapsulant, was specifically developed to relieve the stress placed on toroidal coils or electronic components that will experience pressure during the molding process. With a durometer Shore D hardness of 5, the UV encapsulant

MLT/Micro-Lite Technology

Thermally Conductive Adhesives

Thermally Conductive Adhesives

New Equipment | Materials

For heat dissipation Conventional methods measure an adhesive's bulk conductivity, in watts/m-°K. However, across a thin bondline, the resistance of the adhesive itself is only a fraction of the total resistance. Interfacial resistance is a signifi

Zymet, Inc

Aqueous Technologies Discusses the Challenges of Modern Day Cleaning at the SMTA Intermountain Expo

Industry News | 2015-04-09 19:50:17.0

Aqueous Technologies announces that its CEO Michael Konrad presented during the recent SMTA Intermountain Expo at Boise State University. Mr. Konrad presented “Low Standoffs, High Densities, and High Reflow Technologies. The Challenges of Modern Day Cleaning.

Aqueous Technologies Corporation

Validity of the IPC R.O.S.E. Method 2.3.25 Researched

Technical Library | 2010-06-10 21:01:48.0

This paper researches the effectiveness of the R.O.S.E. cleanliness testing process for dissolving and measuring ionic contaminants from boards soldered with no-clean and lead-free flux technologies.

KYZEN Corporation

Materials and Measurement in Brighton

Industry News | 2003-05-05 08:32:30.0

Nepcon UK in Brighton will host the latest in electronics materials and electronics reliability measurement equipment from Concoat.

Concoat Ltd.


fail ionic contamination searches for Companies, Equipment, Machines, Suppliers & Information

Online Equipment Auction of Altronic: Small-Batch Surface Mount & Assembly Facility

High Precision Fluid Dispensers
Conductive Adhesive & Non-Conductive Adhesive Dispensing

High Throughput Reflow Oven
PCB Handling with CE

World's Best Reflow Oven Customizable for Unique Applications