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MIRTEC WINS SERVICE EXCELLENCE AWARD FOR TEST AND INSPECTION FOUR YEARS IN A ROW!

Industry News | 2018-02-28 17:52:51.0

MIRTEC, “The Global Leader in Inspection Technology”, announces that it received the prestigious 2018 Service Excellence Award (SEA) from Circuits Assembly Magazine in the category of Test and Inspection. This is the fourth year in a row that MIRTEC has received this award for outstanding customer service! Mike Buetow, Circuits Assembly’s Editor-in-Chief, presented the award to Brian D’Amico, President of MIRTEC’s North American Sales and Service Division during a Tuesday, Feb. 27, 2018 ceremony that took place at the San Diego Convention Center.

MIRTEC Corp

MIRTEC WINS SERVICE EXCELLENCE AWARD FOR TEST AND INSPECTION FIVE YEARS IN A ROW!

Industry News | 2019-01-30 08:03:04.0

MIRTEC, “The Global Leader in Inspection Technology”, announces that it received the prestigious 2019 Service Excellence Award (SEA) from Circuits Assembly Magazine in the category of Test and Inspection. This is the fifth consecutive year that MIRTEC has received this award for outstanding customer service! Mike Buetow, Circuits Assembly’s Editor-in-Chief, presented the award to Brian D’Amico, President of MIRTEC’s North American Sales and Service Division during a Tuesday, Jan. 29, 2019 ceremony that took place at the San Diego Convention Center.

MIRTEC Corp

MIRTEC WINS SERVICE EXCELLENCE AWARD FOR TEST AND INSPECTION SIX YEARS IN A ROW !

Industry News | 2020-02-06 04:17:15.0

MIRTEC is pleased to announce that it received the prestigious 2020 Service Excellence Award (SEA) from CIRCUITS ASSEMBLY magazine in the category of Test and Inspection. This is the sixth consecutive year that MIRTEC has received this award for outstanding customer service! Mike Buetow, CIRCUITS ASSEMBLY’s Editor-in-Chief, presented the award to Brian D’Amico, President of MIRTEC’s North American Sales and Service Division during a Tuesday, Feb. 4, 2020 ceremony that took place at the San Diego Convention Center during the IPC APEX EXPO.

MIRTEC Corp

MV-7 OMNI 3D AOI Series

MV-7 OMNI 3D AOI Series

New Equipment | Inspection

► Exclusive 15MP CoaXPress Camera System ► OMNI-VISION® 3D Digital Tri-Frequency Moiré Technology ► Leading-Edge 12 Projection Blue DLP Technology ► Precision Compound Telecentric Camera Lens ► Eight Phase Color Lighting System ► 10MP

MIRTEC Corp

MV-9 3D AOI Series

MV-9 3D AOI Series

New Equipment | Inspection

► Exclusive 15MP / 25MP CoaXPress Camera System ► OMNI-VISION® 3D Digital Tri-Frequency Moiré Technology ► Leading-Edge 12 Projection Blue DLP Technology ► Precision Compound Telecentric Camera Lens ► Eight Phase Color Lighting System

MIRTEC Corp

MV-3 OMNI Desktop 3D AOI Series

MV-3 OMNI Desktop 3D AOI Series

New Equipment | Inspection

► Exclusive 15MP / 25MP CoaXPress Camera System ► OMNI-VISION® 3D Digital Tri-Frequency Moiré Technology ► Leading-Edge 12 Projection Blue DLP Technology ► Precision Compound Telecentric Camera Lens ► Eight Phase Color Lighting System ► 10MP / 1

MIRTEC Corp

MV-6 OMNI 3D AOI Series

MV-6 OMNI 3D AOI Series

New Equipment | Inspection

► Exclusive 15MP / 25MP CoaXPress Camera System ► OMNI-VISION® 3D Digital Tri-Frequency Moiré Technology ► Leading-Edge 12 Projection Blue DLP Technology ► Precision Compound Telecentric Camera Lens ► Eight Phase Color Lighting System ► 10MP / 1

MIRTEC Corp

Altium Unveils New �Board-on-Chip� Technology

Industry News | 2003-04-30 08:37:19.0

Altium to preview industry-first technology at Programmable World that allows engineers to use board-level methodologies to design and implement embedded systems on FPGAs

SMTnet

2002 NEMI Roadmap Points to Areas of Opportunity for Industry

Industry News | 2003-04-07 10:16:38.0

Portable Products and Optoelectronic Applications Still Hold Promise for Growth

SMTnet

DIN Connectors Have All Applications Covered

Industry News | 2003-06-17 08:50:16.0

The CECC-approved DIN EN60603-2 (DIN41612) Series is ideal for electronics equipment requiring reliable yet inexpensive circuit board interconnection.

SMTnet


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