Industry News | 2013-01-21 12:35:28.0
Digitaltest announced a new Vice President of Sales for the Americas, Paul R. Groome. He most recently held the position of Sales and Marketing Manager at MVP. Prior to MVP, he held Business Unit Management positions at both Teradyne and GenRad. “Paul has an excellent record in the Test and Inspection markets and brings strong experience to Digitaltest. He will be a huge asset in further strengthening Digitaltest’s position in the Americas,” states Mrs. Boctor, Digitaltest President and CEO.
Industry News | 2008-08-25 21:25:22.0
San Jose, CA., Aug 20, 2008 � On the heals of increasing board complexity and size, Solution Sources Programming, Inc. (SSP) has found ways to extend the life of their test equipment by utilizing Agilent's most recent software upgrades for the Agilent 3070 In-Circuit Tester (ICT).
Technical Library | 2020-07-08 20:05:59.0
There is a compelling need for functional testing of high-speed input/output signals on circuit boards ranging from 1 gigabit per second (Gbps) to several hundred Gbps. While manufacturing tests such as Automatic Optical Inspection (AOI) and In-Circuit Test (ICT) are useful in identifying catastrophic defects, most high-speed signals require more scrutiny for failure modes that arise due to high-speed conditions, such as jitter. Functional ATE is seldom fast enough to measure high-speed signals and interpret results automatically. Additionally, to measure these adverse effects it is necessary to have the tester connections very close to the unit under test (UUT) as lead wires connecting the instruments can distort the signal. The solution we describe here involves the use of a field programmable gate array (FPGA) to implement the test instrument called a synthetic instrument (SI). SIs can be designed using VHDL or Verilog descriptions and "synthesized" into an FPGA. A variety of general-purpose instruments, such as signal generators, voltmeters, waveform analyzers can thus be synthesized, but the FPGA approach need not be limited to instruments with traditional instrument equivalents. Rather, more complex and peculiar test functions that pertain to high-speed I/O applications, such as bit error rate tests, SerDes tests, even USB 3.0 (running at 5 Gbps) protocol tests can be programmed and synthesized within an FPGA. By using specific-purpose test mechanisms for high-speed I/O the test engineer can reduce test development time. The synthetic instruments as well as the tests themselves can find applications in several UUTs. In some cases, the same test can be reused without any alteration. For example, a USB 3.0 bus is ubiquitous, and a test aimed at fault detection and diagnoses can be used as part of the test of any UUT that uses this bus. Additionally, parts of the test set may be reused for testing another high-speed I/O. It is reasonable to utilize some of the test routines used in a USB 3.0 test, in the development of a USB 3.1 (running at 10 Gbps), even if the latter has substantial differences in protocol. Many of the SI developed for one protocol can be reused as is, while other SIs may need to undergo modifications before reuse. The modifications will likely take less time and effort than starting from scratch. This paper illustrates an example of high-speed I/O testing, generalizes failure modes that are likely to occur in high-speed I/O, and offers a strategy for testing them with SIs within FPGAs. This strategy offers several advantages besides reusability, including tester proximity to the UUT, test modularization, standardization approaching an ATE-agnostic test development process, overcoming physical limitations of general-purpose test instruments, and utilization of specific-purpose test instruments. Additionally, test instrument obsolescence can be overcome by upgrading to ever-faster and larger FPGAs without losing any previously developed design effort. With SIs and tests scalable and upward compatible, the test engineer need not start test development for high-speed I/O from scratch, which will substantially reduce time and effort.
Used SMT Equipment | In-Circuit Testers
Model: 3070 Prod. Year: 2008 Test head US34240086 Brand: Agilent Technologies Machine specification: System chassis: 2-module frame with 2 modules populated 1 – 3070 In-Circuit Tester (E1026A)
Industry Directory | Consultant / Service Provider / Manufacturer
Specializing in electronic circuit board assembly services. Various capabilities include engineering, assembly, designing, prototyping,supply chain management, testing, documentation, rework, repair and soldering. On-time delivery
Industry News | 2001-02-05 09:17:03.0
EvaluTech 2001, the new test event that has evolved from the growing test and inspection portion of NEPCON West, will host the five largest test and inspection companies at the upcoming exhibition, February 27 - March 1, 2001 at the Anaheim Convention Center in Anaheim, California. SPEA, the Italian based automatic test equipment manufacturer and newest participant, joins GenRad, Agilent, Teradyne, National Instruments, and many others on the exhibit floor.
Industry News | 2019-01-21 10:13:48.0
Taipei, Taiwan] Test Research, Inc. (TRI) will reach a milestone this year, celebrating 30 years of business. Test Research, Inc. will be marking the anniversary throughout the year by showcasing Smart Factory Test and Inspection Solutions at seminars, exhibitions and trade shows. Founded on April 1989, Test Research, Inc. has grown
New Equipment | Test Equipment
Improve both board test coverage and test throughput at in-circuit test with i3070 and i1000D ICT systems that offer one of the best ROICs available in the market today. The Medalist i3070, the next generation In-Circuit Test System, enables 20% mo
Industry News | 2010-02-08 23:18:15.0
FREMONT, CA — February 2010 — Datest Corp., a leading provider of advanced, efficient and quality in-circuit testing solutions, announces that it has received the official International Traffic in Arms Regulations (ITAR) registration from the US Department of State, Bureau of Political-Military Affairs.
Industry News | 2010-02-11 15:54:41.0
FREMONT, CA — February 2010 — Datest Corp., a leading provider of advanced, efficient and quality in-circuit testing solutions, announces that it has received the official International Traffic in Arms Regulations (ITAR) registration from the US Department of State, Bureau of Political-Military Affairs. This registration documents Datest Corp.’s dedication to adhering to the regulations that control the export and import of defense-related articles and services on the United States Munitions List.
I.C.T is a manufacturer from China that offers SMT, DIP, PCBA conformal coating equipment and turnkey solution.
I.C.T Industrial Park, Building 1
Dongguan, 30 China
Phone: +86 13670124230