Used SMT Equipment | In-Circuit Testers
Agilent-Keysight E7495A Agilent E7495A Base Station Test Set The Agilent E7495A Base Station Test Set is designed to simplify the job of installing and maintaining base stations. By combining all important base station diagnostic tools in one r
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight E7495A Agilent E7495A Base Station Test Set The Agilent E7495A Base Station Test Set is designed to simplify the job of installing and maintaining base stations. By combining all important base station diagnostic tools in one r
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight DSO81304A Bandwidth: 13.0 GHz Channels: 4 12 GHz bandwidth, 13 GHz DSP enhanced bandwidth oscilloscope with up to 40 GSa/s sample rate Up to 2 Mpts MegaZoom deep memory at 40 GSa/s sample rates and 64 Mpts MegaZoom deep memory a
Used SMT Equipment | In-Circuit Testers
Agilent-Keysight N5182A-506 Agilent/HP N5182A MXG RF Vector Signal Generator Featuring fast frequency, amplitude, and waveform switching, high power with an electronic attenuator, and high reliability -all in two rack units (2RU) - Agilent MXG
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are availa
Used SMT Equipment | In-Circuit Testers
123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/
Industry News | 2010-02-12 09:54:05.0
Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Ryan Satrom and Valts Treibergs will present a paper titled “An Improved Characterization Technique for Contactors” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/ Mesa Hotel in Mesa, Ariz. The presentation will be held during Session 4, which will take place Tuesday March 9, 2010 at 10:30 a.m.
Industry News | 2020-10-27 12:46:27.0
DAGE Products was awarded a 2020 Mexico Technology Award in the category of Test Equipment for its new DAGE Prospector™ Micro Materials Tester. The award was presented to the company during a Virtual Awards Ceremony that took place Monday, October 26, 2020.
Used SMT Equipment | In-Circuit Testers
Litepoint IQView 802.11a/b/g WLAN Test Solution The LitePoint IQview 802.11a/b/g/n WLAN Test Solution is a popular test instrument for RF testing of 802.11a/b/g WLAN products, including MIMO and optional Bluetooth + EDR. Network interface cards
