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Agilent E7495A

Agilent E7495A

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight E7495A Agilent E7495A Base Station Test Set The Agilent E7495A Base Station Test Set is designed to simplify the job of installing and maintaining base stations. By combining all important base station diagnostic tools in one r

Test Equipment Connection

Agilent E7495A

Agilent E7495A

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight E7495A Agilent E7495A Base Station Test Set The Agilent E7495A Base Station Test Set is designed to simplify the job of installing and maintaining base stations. By combining all important base station diagnostic tools in one r

Test Equipment Connection

Agilent DSO81304A

Agilent DSO81304A

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight DSO81304A Bandwidth: 13.0 GHz Channels: 4 12 GHz bandwidth, 13 GHz DSP enhanced bandwidth oscilloscope with up to 40 GSa/s sample rate Up to 2 Mpts MegaZoom deep memory at 40 GSa/s sample rates and 64 Mpts MegaZoom deep memory a

Test Equipment Connection

Agilent N5182A-506

Agilent N5182A-506

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight N5182A-506 Agilent/HP N5182A MXG RF Vector Signal Generator Featuring fast frequency, amplitude, and waveform switching, high power with an electronic attenuator, and high reliability -all in two rack units (2RU) - Agilent MXG

Test Equipment Connection

Agilent E5071C-280-019-1E5

Agilent E5071C-280-019-1E5

Used SMT Equipment | In-Circuit Testers

123 dB dynamic range at test port (typical)     Fast measurement speed: 39 ms @ full 2-port cal, 1601 points     Low trace noise: 0.004 dB rms @ 70 kHz IFBW     Integrated 2- and 4-ports with balanced measurements     Frequency options are availa

Test Equipment Connection

Agilent  E5071C-285

Agilent E5071C-285

Used SMT Equipment | In-Circuit Testers

123 dB dynamic range at test port (typical)     Fast measurement speed: 39 ms @ full 2-port cal, 1601 points     Low trace noise: 0.004 dB rms @ 70 kHz IFBW     Integrated 2- and 4-ports with balanced measurements     Frequency options are availa

Test Equipment Connection

Agilent E5071C-440

Agilent E5071C-440

Used SMT Equipment | In-Circuit Testers

123 dB dynamic range at test port (typical) Fast measurement speed: 39 ms @ full 2-port cal, 1601 points Low trace noise: 0.004 dB rms @ 70 kHz IFBW Integrated 2- and 4-ports with balanced measurements Frequency options are available: From 9 kHz/

Test Equipment Connection

Multitest’s Ryan Satrom to Present at BiTS 2010

Industry News | 2010-02-12 09:54:05.0

Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Ryan Satrom and Valts Treibergs will present a paper titled “An Improved Characterization Technique for Contactors” at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/ Mesa Hotel in Mesa, Ariz. The presentation will be held during Session 4, which will take place Tuesday March 9, 2010 at 10:30 a.m.

Multitest Elektronische Systeme GmbH

New DAGE Prospector™ Micro Materials Tester Impresses with Another Award

Industry News | 2020-10-27 12:46:27.0

DAGE Products was awarded a 2020 Mexico Technology Award in the category of Test Equipment for its new DAGE Prospector™ Micro Materials Tester. The award was presented to the company during a Virtual Awards Ceremony that took place Monday, October 26, 2020.

Nordson DAGE

Litepoint Litepoint IQView

Litepoint Litepoint IQView

Used SMT Equipment | In-Circuit Testers

Litepoint IQView 802.11a/b/g WLAN Test Solution The LitePoint IQview 802.11a/b/g/n WLAN Test Solution is a popular test instrument for RF testing of 802.11a/b/g WLAN products, including MIMO and optional Bluetooth + EDR. Network interface cards

Test Equipment Connection


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