Pure tungsten sheet, plate, tungsten alloy sheet, plate. Alloy Sheet(thickness) W1 0.5-8.0 CW1 0.5-8.0 W2 0.5-8.0 WAl1 0.5-8.0 WAl2 0.5-8.0 WAl3 0.5-8.0 WCe15 0.5-8.0 WTh7 0.5-8.0 WTh10 0.5-8.0 WTh15 0.5-8.0 Wl10 0.5-8.0 W-Ni-Fe 0.5-8.0
Tungsten and Tungsten Alloy Bars&Rods Alloy Bar W1 ����2.0 CW1 ��2.0-5.0 W2 ����2.0 WAl1 ��2.8-11.0 WAl2 ��2.8-11.0 WAl3 ��2.8-11.0 WCe15 ��1.0-10.0 WTh7 ��0.8-2.8 WTh10 ��2.8-10.0 WTh15 ��2.8-10.0 Wl10 ��2.8-10.0 W-Ni-Fe ����5.0 W-Ni-
Complete TTC Solutions for Electronics Applications Industry leaders within electronics and semiconductor manufacturing need to enable lean manufacturing, assure quality, and optimize efficient use of resources. Microscan products help these compan
Used SMT Equipment | Pick and Place/Feeders
Spare parts for Universal Radial and Axial through-hole insertion machines (RAD5 6360D, RAD8 6380A, RAD8 XT 6380B, VCD5 6241D, VCD8 6241F, VCD Dual 6292A, SEQ 2596A, SEQ5, SEQ8). UIC Part Number / Part Description 15754 O'RING 15755 O'RING 15759
reflowsystems.com manufactures and distributes three series of ovens to offer a perfect fit in size and price for every production need: 1) CORA 450 and 250 are combining not only COnvection and RAdiation to guarantee stressfree soldering of BGAs eve
New Equipment | Test Equipment
The Lambda Software Option is Availible on the MTS 30 and MTS 300 test Systems. Dependant on configuration the Lambda systems allow for tests of 2, 4 or 6 boards in parallel. The Lambda Edition test system enables users to perform parallel tests
Parts & Supplies | SMT Equipment
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Parts & Supplies | SMT Equipment
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New Equipment | Test Equipment
Now YOU Can Test for Presence of Lead and Other RoHS/WEEE Elements in as Little as 15 Seconds! Patented Micro X-Ray Fluorescence Technology Ensures Safety, Accuracy and Simplicity Safe, Self-Contained System Lead-Free, RoHS/WEEE, Elemental Metal
DOCTAR is used validate design changes throughout the hardware board design and manufacturing lifecycle. DOCTAR analyzes changes to both to physical and logical elements in the design database. Test point analysis includes test points that have b
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