Technical Library | 2021-03-24 01:26:05.0
In-circuit test (ICT) has remained one of the most popular and cost-effective test methods for medium and high volume printed circuit board assembly (PCBA) for many years. This is due to its component-level fault diagnosis capability- and its speed.
Technical Library | 1999-05-07 11:24:21.0
Many manufacturers have now completed the conversion to no clean solder paste. Many factors governed this initial conversion, among those being cosmetics, solder ability, and process ability. In circuit testing or probing through no clean solder paste residues has topically not been a major factor in the conversion decision for several reasons. Due to board design, solder paste was only used on one side of the board and not subjected to testing...
Career Center | Tampa, Florida USA | Engineering
We need your expertise in In-Circuit test development and production testing. You will work closing with design, process and quality engineers to ensure that test hardware and software provides accurate results. Prepare test strategies to be used f
Industry Directory | Manufacturer
PCB test software developer & automation equipment provider
Technical Library | 2010-09-02 13:13:03.0
As chip packaging and interconnectivity have become more dense and operate at higher clock frequencies, physical access for traditional bed-of-nails testing becomes limited. This results in loss of ICT (in-circuit test) fault coverage and higher test fi
Technical Library | 2012-12-14 14:25:37.0
The popularity of low voltage technologies has grown significantly over the last decade as semiconductor device manufacturers have moved to satisfy market demands for more powerful products, smaller packaging, and longer battery life. By shrinking the size of the features they etch into semiconductor dice, IC manufacturers achieve lower costs, while improving speed and building in more functionality. However, this move toward smaller features has lead to lower breakdown voltages and increased opportunities for component overstress and false failures during in-circuit test.
Technical Library | 2012-11-29 14:23:58.0
1000 units per day) production environment presents challenging technical, logistic and cost obstacles that are usually more complex than those encountered at the inspection (automated optical inspection) and the manufacturing process test step (in-circuit test).
In-Circuit Test fixtures for Fairchild/Schlumberger, Genrad, Teradyne
Career Center | Owings Mills, Maryland USA | Engineering,Production
In this role with TTCI you will specialize in the development of In-Circuit Test (ICT) sets for Agilent 3070 (Formerly HP) and/or Teradyne (Formerly GenRad) TestStation/228X test systems. Candidates should have at least 7 years experience with in-c
