PAM+ is a graphic software tool designed to give the users the ability to verify machine placement accuracy...without the need for AOI or external camera systems. Automatically calculates and displays current Cp, Cpk and 3 Sigma values according to t
Industry Directory | Manufacturer
contract manufacturer for PCBA in China , your reliable EMS partner.
New Equipment | Test Equipment
Inline test system for incircuit and functional tests with Teradyne measuring equipment ENGMATEC presented for the first time a test handler with integrated Test Station Inline TSi from Teradyne. On request of the Boston company Teradyne, a test
Career Center | Sugar Land, Texas USA | Production
Ability to troubleshoot to componenet level of analog and digital circuits. Ability to read schematics and failure analysis. Experience with incircuit and functional testing needed. Will test and debug to customer specifications. Perform set up
Career Center | Dallas, Texas USA | Engineering
Skills/Requirements: BSEE, BSET in electronic field, tech courses w/Equiv work, must have working knowledge of production testing of electronic assemblies containing digital/analog circuitry and power supplies. Candidates must be familiar with in-cir
Industry Directory | Manufacturer
Stencils-Solder Paste, Glues, Epoxies; Process pallets, wave solder pallets; Inspection Templates: Laser Micromachining, Incircuit Test Fixtures: Programming Probe
Industry Directory | Consultant / Service Provider
Founded in 1993, ASTER develops a wide range of products dealing with PCB Testability, Viewing and Quality Management.
Technical Library | 2012-12-14 14:28:20.0
This paper examines the potential failure mechanisms that can damage modern lowvoltage CMOS devices and their relationship to electrical testing. Failure mechanisms such as electrostatic discharge (ESD), CMOS latch-up, and transistor gate oxide degradation can occur as a result of electrical over-voltage stress (EOS). In this paper, EOS due to electrical testing is examined and an experiment is conducted using pulsed voltage waveforms corresponding to conditions encountered during in-circuit electrical testing. Experimental results indicate a correlation between amplitude and duration of the pulse waveform and device degradation due to one or more of the failure mechanisms.
Technical Library | 2013-08-07 21:52:15.0
PCB architectures have continued their steep trend toward greater complexities and higher component densities. For quality control managers and test technicians, the consequence is significant. Their ability to electrically test these products is compounded with each new generation. Probe access to high density boards loaded with micro BGAs using a conventional in-circuit (bed-of-nails) test system is greatly reduced. The challenges and complexity of creating a comprehensive functional test program have all but assured that functional test will not fill the widening gap. This explains why sales of automated-optical and automated X-ray inspection (AOI and AXI) equipment have dramatically risen...
Technical Library | 2021-05-20 13:55:14.0
Quality Control is essential in production processes. In the PCB Assembly process there are several Quality Control steps or options. The most popular tests are the electrical (In-Circuit or ICT) and the function (functional or FCT/FVT) test. ICT test fixtures are standardized and there are several major test platforms available which are industry standards. For FCT applications there are many more variations possible due to the vast number of testers and interface approaches unique to each customer; also due to an endless list of applications which fall under the category of Functional Test (RF, High Current, LED test, Leak test etc.) Test Probes are a very important part in ICT as well as in FCT applications. If the wrong test probe (type, spring force, tip style etc.) is used, the test fixture will not work as intended. In addition the test probe must be installed correctly in order to work properly. This presentation will show general information and some guidelines for a proper Test Fixture design to assure the most efficient production.
