New Equipment | Test Equipment
Localized Electronics Cleanliness Tester and Residue Extractor The information gathered when using the C3 is intended to provide a measure of the cleanliness of a localized region of a circuit board. In addition, the C3 extracts a sample of the effl
Electronics Forum | Fri Jun 05 15:06:26 EDT 1998 | Dave F
| I have just been assigned to look into the ionic chromotograhy test on our PCBA but I have zero knowledge. Could anyone help to explain what is this test about? Is it | a) a destructive test? | b) What is the measurement unit of this test? | c) Wh
Electronics Forum | Wed Oct 18 09:35:54 EDT 2000 | mike weekes
Does anyone know of a less expensive technique to monitor board cleanliness (chlorides in micrograms/in2) other than omega mater - ion chromatography is costing us an arm and a leg.
Industry News | 2016-11-30 14:47:45.0
ACI Technologies invites you to download a free copy of its very popular e-booklet, “Failure Analysis Techniques for Electronics” from its Website store, which is located at http://store.aciusa.org/Failure-Analysis-Techniques-for-Electronics-Digital-Download-P181.aspx
Industry News | 2012-06-18 14:49:38.0
Reliability and Failure Analysis Seminar: Lessons Learned in Manufacturing. Presented by Universal Instruments Corporation’s Advanced Process Laboratory. Hosted by Textron Defense Systems, 201 Lowell St., Wilmington, MA
Technical Library | 2021-04-29 01:47:17.0
For the separation of ionic species, ion chromatography (IC), a type of liquid chromatography, is the method of choice. The most critical component of this technique is the separation column, which is selected based on factors that include the specific analytes of interest, the sample type and the required detection levels. This article outlines the column parameters that impact the separation of charged species in solution using ion-exchange chromatography and the developments that have continued to redefine what is possible with an IC system.
Technical Library | 2023-12-26 17:50:54.0
In this white paper, we discuss the pros and cons of five analytical techniques when applied to residue analysis on electronic assemblies. We evaluate the following for their application and limitations for analyzing both visible and invisible residues: FITR, SEM/EDX, XRF, Ion Chromatography, and ROSE
Events Calendar | Mon Jun 08 00:00:00 EDT 2020 - Mon Jun 08 00:00:00 EDT 2020 | ,
Practical Set-Up, Qualification of Cleaning Process in PCB Assembly
Events Calendar | Mon Apr 23 00:00:00 EDT 2018 - Thu Apr 26 00:00:00 EDT 2018 | Shanghai, China
SMTA China East Conference 2018
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SMTnet Express, April 29, 2021, Subscribers: 27,195, Companies: 11,344, Users: 26,617 Failure Analysis – Using Ion Chromatography And Ion Chromatography/Mass Spec (IC/MS) Since the 1980s the electronics industry has utilized ion
