See the Nu/Clean Aqua Batch Aqueous Batch Cleaner in operation! Quick, quiet, close loop cleaning at a great price! For technical specifications, visit our website www.TechnicalDev.com.
Career Center | Milpitas, California USA | Clerical,Production,Quality Control,Research and Development,Technical Support
Winslow Automation, Inc. (aka Six Sigma), an industry leader in electronic component interconnect technology & related test and failure analysis services, is seeking a ‘hands on’ Materials Engineer to join our Test services team. This individual wi
Industry Directory | Consultant / Service Provider / Manufacturer
Lepla srl electronic contract manufacturer, specialized in the SMT & THT Electronic Cards Assembling, Wiring Assembling Harness, In-Circuit, Parametric and Functional Testing.
Technical Library | 2017-07-13 16:16:27.0
Controlled humidity and temperature controlled surface insulation resistance (SIR) measurements of flux covered test vehicles, subject to a direct current (D.C.) bias voltage are recognized by a number of global standards organizations as the preferred method to determine if no clean solder paste and wave soldering flux residues are suitable for reliable electronic assemblies. The IPC, Japanese Industry Standard (JIS), Deutsches Institut fur Normung (DIN) and International Electrical Commission (IEC) all have industry reviewed standards using similar variations of this measurement. (...) This study will compare the results from testing two solder pastes using the IPC-J-STD-004B, IPC TM-650 2.6.3.7 surface insulation resistance test, and IPC TM-650 2.3.25 in an attempt to investigate the correlation of ROSE methods as predictors of electronic assembly electrical reliability.
Technical Library | 2022-12-19 18:59:51.0
Material and Process Characterization studies can be used to quantify the harmful effects that might arise from solder flux and other process residues left on external surfaces after soldering. Residues present on an electronic assembly can cause unwanted electrochemical reactions leading to intermittent performance and total failure. Components with terminations that extend underneath the package can trap flux residue. These bottom terminated components are flush with the bottom of the device and can have small solderable terminations located along the perimeter sides of the package. The clearance between power and ground render high electrical forces, which can propagate electrochemical interactions when exposed to atmospheric moisture (harsh environments). The purpose of this research is to predict and understand the functional performance of residues present under single row QFN component packages. The objective of the research study is to develop and collect a set of guidelines for understanding the relationship between ionic contamination and electrical performance of a BTC component when exposed to atmospheric moisture and the trade-offs between electrical, ionic contamination levels, and cleanliness. Utilizing the knowledge gained from undertaking the testing of QFN components and associated DOE, the team will establish a reference Test Suite and Test Spec for cleanliness.
Industry News | 2009-10-22 12:44:35.0
RANCHO CUCAMONGA, CA — October 2009 — Aqueous Technologies Corp. announces the video release of the Zero-Ion Ionic Contamination (Cleanliness) Tester. The Zero-Ion G3 represents the next generation of ionic contamination testing systems.
Industry News | 2017-10-11 17:23:58.0
Specialty Coating Systems (SCS) announced today the launch of the Omegameter SMD 650, the next-generation, software-controlled Omegameter ionic contamination test system.
Events Calendar | Mon Oct 07 00:00:00 EDT 2019 - Tue Oct 08 00:00:00 EDT 2019 | ,
PCBA Cleanliness End-of-Project Webinar
Industry News | 2008-03-20 15:59:15.0
Rancho Cucamonga, CA - March 2008 � Aqueous Technologies Corp. announces that it will feature the Zero-Ion Ionic Contamination (Cleanliness) Tester, which is designed to test electronics assemblies for ionic contamination, in booth 2431 at the upcoming APEX 2008 exhibition and conference scheduled to take place April 1-3, 2008 in Las Vegas.
Industry News | 2009-03-10 17:38:33.0
Rancho Cucamonga, CA - January 2009 � Aqueous Technologies Corp. announces that it will introduce the newly updated Zero-Ion Ionic Contamination (Cleanliness) Tester, which is designed to test electronics assemblies for ionic contamination, in booth 2247 at the upcoming IPC/APEX conference and exhibition, scheduled to take place March 31-April 2, 2009 in Las Vegas.
