Full Site - : ionic cleanliness (Page 5 of 36)

Aqueous Technologies to Feature C3 Cleanliness Tester at APEX 2008

Industry News | 2008-03-12 16:21:20.0

Rancho Cucamonga, CA - March 2008 � Aqueous Technologies Corp. announces that it will exhibit the C3 Cleanliness Tester in booth 2431 at the upcoming APEX 2008 exhibition and conference scheduled to take place April 1-3, 2008 in Las Vegas.

Aqueous Technologies Corporation

Aqueous Technologies Offers Special Online Sale Price for Zero-Ion g3

Industry News | 2011-11-01 10:52:43.0

Aqueous Technologies announces the upcoming 30th anniversary of the Zero-Ion Ionic Contamination (cleanliness) Tester.

Aqueous Technologies Corporation

Aqueous Technologies C3 Cleanliness Tester Wins VISION Award

Industry News | 2008-04-08 22:13:06.0

Rancho Cucamonga, CA - April 2, 2008 � Aqueous Technologies Corp. announces that it has been awarded a SMT VISION Award in the category of Testing for its C3 Cleanliness Tester. The award was presented to the company during a Wednesday, April 2, 2008 ceremony that took place in Las Vegas during APEX 2008.

Aqueous Technologies Corporation

Characterize and Understand Functional Performance Of Cleaning QFN Packages on PCB Assemblies

Technical Library | 2022-12-19 18:59:51.0

Material and Process Characterization studies can be used to quantify the harmful effects that might arise from solder flux and other process residues left on external surfaces after soldering. Residues present on an electronic assembly can cause unwanted electrochemical reactions leading to intermittent performance and total failure. Components with terminations that extend underneath the package can trap flux residue. These bottom terminated components are flush with the bottom of the device and can have small solderable terminations located along the perimeter sides of the package. The clearance between power and ground render high electrical forces, which can propagate electrochemical interactions when exposed to atmospheric moisture (harsh environments). The purpose of this research is to predict and understand the functional performance of residues present under single row QFN component packages. The objective of the research study is to develop and collect a set of guidelines for understanding the relationship between ionic contamination and electrical performance of a BTC component when exposed to atmospheric moisture and the trade-offs between electrical, ionic contamination levels, and cleanliness. Utilizing the knowledge gained from undertaking the testing of QFN components and associated DOE, the team will establish a reference Test Suite and Test Spec for cleanliness.

iNEMI (International Electronics Manufacturing Initiative)

The Relationship Between Cleanliness and Reliability/Durability

Technical Library | 2023-04-17 21:25:52.0

Outline/Agenda * Introduction of Ionics and ROSE * Evolution in technology * Rev H in the IPC-J-STD-001 * Real World Case Study * Conclusions

KYZEN Corporation

Circuit Technology Center Commissions New XRF X-ray System

Industry News | 2021-08-13 08:37:00.0

Circuit Technology Center announces that it has recently purchased and commissioned an Oxford 980 X-Strata series XRF (x-ray fluorescence) system to support the testing of electronic components for restricted substances such as lead or tin above specified limits. The system can also verify the coating thickness. Defense base customers often require XRF verification testing of components after components have been processed through lead-free to leaded solder alloy exchange for tin mitigation applications. XRF testing may also be required to verify RoHS compliance of components that have been re-balled or re-processed for lead-free applications. In addition to XRF testing, Circuit Technology Center also supports ionic cleanliness testing, X-ray, Acoustic Microscopy, Solderability, and BGA ball shear testing services.

Circuit Technology Center, Inc.

Aqueous Technologies to Display Zero-Ion Contamination Tester at APEX 2008

Industry News | 2008-03-20 15:59:15.0

Rancho Cucamonga, CA - March 2008 � Aqueous Technologies Corp. announces that it will feature the Zero-Ion Ionic Contamination (Cleanliness) Tester, which is designed to test electronics assemblies for ionic contamination, in booth 2431 at the upcoming APEX 2008 exhibition and conference scheduled to take place April 1-3, 2008 in Las Vegas.

Aqueous Technologies Corporation

Aqueous Technologies to Feature New Generation Zero-Ion Contamination Tester at APEX 2009

Industry News | 2009-03-10 17:38:33.0

Rancho Cucamonga, CA - January 2009 � Aqueous Technologies Corp. announces that it will introduce the newly updated Zero-Ion Ionic Contamination (Cleanliness) Tester, which is designed to test electronics assemblies for ionic contamination, in booth 2247 at the upcoming IPC/APEX conference and exhibition, scheduled to take place March 31-April 2, 2009 in Las Vegas.

Aqueous Technologies Corporation

Aqueous Technologies Launches Video Dedicated to the Zero-Ion G3

Industry News | 2009-10-22 12:44:35.0

RANCHO CUCAMONGA, CA — October 2009 — Aqueous Technologies Corp. announces the video release of the Zero-Ion Ionic Contamination (Cleanliness) Tester. The Zero-Ion G3 represents the next generation of ionic contamination testing systems.

Aqueous Technologies Corporation

Aqueous Technologies Will Demo Its Cleaning and Cleanliness Testing Products at productronica

Industry News | 2015-10-21 18:15:47.0

Aqueous Technologies will exhibit in Hall A2, Booth 528 at the productronica International Trade Fair, scheduled to take place Nov. 10-13, 2015 at the Messe München exhibition center in Munich, Germany. Company representatives will demonstrate the Trident ZDO and Zero-Ion G3.

Aqueous Technologies Corporation


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