Industry News | 2013-02-27 11:15:11.0
Multitest, will exhibit in Booth #K4 at the Burn-in & Test Strategies Workshop (BiTS), scheduled to take place March 3-6, 2013 in Mesa, AZ.
Industry News | 2012-07-19 13:24:57.0
Multitest, announces that its MT9928 gravity handler ideally supports the special features of the recently launched ecoAmp Kelvin contactor.
Industry News | 2011-12-19 18:04:15.0
Multitest introduces the MT Pro Support Program for complete after-sales support.
Industry News | 2011-12-07 21:07:58.0
Multitest announces that James Quinn was named Vice President of Global Sales & Marketing effective November 14, 2011.
Industry News | 2012-01-05 19:20:11.0
Multitest announces that its UltraFlat™ process meets the requirements of high parallel vertical probe card applications.
Industry News | 2013-03-21 12:34:55.0
Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, congratulates Mr. Rafael Reyes, the winner of its recent drawing. All survey participants were entered into a drawing for an iPad mini.
Industry News | 2013-03-01 13:33:11.0
Melexis, a mixed signal semiconductor manufacturer headquartered in Belgium, has chosen Multitest’s Standard MT9510 Pick and Place Test Handler for an infrared, light sensing application
Industry News | 2018-03-29 07:35:52.0
Multitest’s ecoAmp Kelvin Contactor successfully passed an in-depth evaluation phase at a major IDM. Based on the performance, which was demonstrated in a challenging high power application, the customer decided to make the Multitest ecoAmp Kelvin Contactor their strategic test interface product for existing and future high power test applications at high volume production.
Industry News | 2011-06-16 14:55:16.0
Multitest announces that its installed base of WLCSP contactors is steadily growing. The contactors are running high-volume production at subcontractors in China, Taiwan, Singapore and other locations. They show outstanding lifetime performance, contributing to unreached cost of test.
Industry News | 2013-03-28 11:03:15.0
Multitest, will present at the VOICE conference, scheduled to take place April 23-25, 2013 at the DoubleTree by Hilton Hotel in San Jose, CA. Meet Multitest’s experts to learn more about the company’s solutions, from wafer-level test to final test – for standard ICs and sensor packages.
