Industry News | 2013-04-11 18:53:28.0
Multitest, will present at the Teradyne Users Group Conference, scheduled to take place April 29-May 1, 2013 in Fort Worth, TX. Meet Multitest’s experts to learn more about the company’s solutions, from wafer-level test to final test – for standard ICs and sensor packages.
Industry News | 2013-11-25 12:14:49.0
Multitest announces that its leading solution for 3-axis magnetometer plus 2-axis low g-test and calibration fully supports the technical features of today’s advanced 3D hall sensors.
Industry News | 2013-08-22 11:29:24.0
Multitest announces that due to mobility and the related demand for connectivity, the data volume in cloud servers is significantly growing.
Industry News | 2012-11-06 15:34:50.0
Multitest, announces that its MT9510 x16 has proven its outstanding temperature accuracy of ±2.0°C at an Asian high-volume production site.
Industry News | 2010-06-23 12:15:55.0
Rosenheim, Germany — Multitest, a designer and manufacturer of final test handlers and final test sockets used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Günther Jeserer, Business Unit Manager, will present a paper titled “Improved Cost of Test by Optimized Tester Utilization” at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco.
Industry News | 2010-06-30 11:49:33.0
Multitest announces that it has once again been named one of the top ten chip making equipment suppliers in the annual Customer Satisfaction Survey conducted by VLSIresearch. The annual survey is conducted globally and provides industry-wide feedback on overall company performance.
Industry News | 2013-12-16 15:13:31.0
Multitest, announces that experts for 3D IC test will present at the European 3D TSV Summit in Grenoble, Jan 20-22, 2014.
Industry News | 2013-11-18 16:32:15.0
Multitest announces that its Mercury 040 Spring Probe Contactor has successfully passed more than five months of evaluation for a strip test application at a SEA high-volume production site.
Industry News | 2010-02-11 15:59:45.0
Rosenheim, Germany — February 2010 — Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, will showcase its leading contactors at the upcoming Burn-in & Test Socket Workshop, schedule to take place March 7-10, 2010 at the Hilton Phoenix East/Mesa Hotel in Mesa, Ariz.
Industry News | 2010-11-24 13:47:37.0
Multitest's board division has successfully introduced a new LCR (layer count reduction) concept for high pin count BGA applications. Board customers now will benefit from significant cost savings without sacrificing performance. With the new LCR concept, the layer count of standard pitch BGA boards can be reduced by up to 40 percent.
