Full Site - : multitest handlers (Page 10 of 15)

Meet Multitest at TUG 2013

Industry News | 2013-04-11 18:53:28.0

Multitest, will present at the Teradyne Users Group Conference, scheduled to take place April 29-May 1, 2013 in Fort Worth, TX. Meet Multitest’s experts to learn more about the company’s solutions, from wafer-level test to final test – for standard ICs and sensor packages.

Multitest Elektronische Systeme GmbH

Innovative Sensors Require Advanced Test Equipment Multitest ships first MEMS tri-temp solution for 3+2 axis magnetic test and calibration

Industry News | 2013-11-25 12:14:49.0

Multitest announces that its leading solution for 3-axis magnetometer plus 2-axis low g-test and calibration fully supports the technical features of today’s advanced 3D hall sensors.

Multitest Elektronische Systeme GmbH

Signal Integrity Engineer at Multitest to Present PCB Material Analysis at IEEE Semiconductor Workshop in San Diego

Industry News | 2013-05-31 13:26:07.0

Multitest,announces that Jason Mroczkowski, Signal Integrity Engineer, will present at the upcoming The IEEE Semiconductor Wafer Test Workshop in San Diego, CA. The presentation entitled, “High Frequency PCB Material Analysis,” is scheduled to take place Wednesday, June 12, 2013 from 10:30-11 a.m.

Multitest Elektronische Systeme GmbH

Chat with Multitest’s Experts at SEMI TechHub – The New SEMICON West Format

Industry News | 2013-07-01 12:53:04.0

Multitest announces that Bernhard Lorenz, VP Engineering, will lead an expert discussion at the TechHub “Test” of SEMICON West exhibition & conference, scheduled to take place July 9-11, 2013 at the Moscone Center in San Francisco, CA.

Multitest Elektronische Systeme GmbH

Multitest's MT2168 Optimizes for Cost and Throughput — Even for Less than 16 Sites

Industry News | 2011-09-28 19:30:18.0

Multitest announces that the MT2168 fully leverages today’s tester capabilities in terms of shorter test times and higher parallelism, e.g. 16 sites.

Multitest Elektronische Systeme GmbH

Test in Carriers: New Customer for the Multitest InCarrier®

Industry News | 2011-06-07 15:02:59.0

Multitest has received another order for its unique InCarrier® test equipment from a major test house in Asia. The InCarrier® was preferred against standard singulated package test as well as other methods of high parallel test.

Multitest Elektronische Systeme GmbH

Multitest Releases Plug & Yield™ Solution

Industry News | 2010-10-06 15:07:30.0

Multitest announces that its new Plug & Yield™ provides significant cost and time savings by enabling users to bring products to market faster and at the lowest possible cost.

Multitest Elektronische Systeme GmbH

Multitest Announces Survey Drawing Winner

Industry News | 2013-03-21 12:34:55.0

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, congratulates Mr. Rafael Reyes, the winner of its recent drawing. All survey participants were entered into a drawing for an iPad mini.

Multitest Elektronische Systeme GmbH

Multitest’s Mercury Contactors for Wafer-Level Test Successfully Deployed to Subcontractors in Asia

Industry News | 2011-03-10 20:49:13.0

Multitest announces that another major fabless semiconductor manufacturer has evaluated and approved its Mercury-based wafer-level contactors. These Mercury contactors have eight sites and more than spring probes per site.

Multitest Elektronische Systeme GmbH

Multitest’s Q-Tip for Mercury™ Contactor Offers the Best First Pass Yield over the Full Tri-Temp Range

Industry News | 2012-10-22 16:10:06.0

Multitest announces that its Mercury™ contactor with Q-tip successfully passed a two-month evaluation at a US-based IDM with test operations in Southeast Asia with excellent first-pass yield for more than 500k insertions.

Multitest Elektronische Systeme GmbH


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