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AutoTRAX EDA Ltd. Appoints John Shotsky, Former Orcad Product Manager, as EDA Tools Product Manager

Industry News | 2003-02-04 08:49:40.0

John Was the Product Manager for Orcad's Schematic Capture and PCB Layout Programs from 1994 to 2001

SMTnet

Electronics Workbench Announces Multisim 7 and Multicap 7 for Professional Circuit Engineers and Designers

Industry News | 2003-05-06 09:05:12.0

New Schematic Capture and Simulation Software Delivers Innovative Features and the Industry�s Best Price/Performance

SMTnet

MIRTEC to Present Complete Line of Advanced 3D AOI and SPI Inspection Systems in Exclusive ONLINE CONFERENCE & EXPO

Industry News | 2020-06-30 15:07:32.0

MIRTEC is excited to announce its participation in an exclusive ONLINE CONFERENCE & EXPO. The event will be broadcast live on Wednesday, July 8, 2020 from 10 a.m. - 2:30 p.m. EST and will include a full program of live presentations, interviews and special guests.

MIRTEC Corp

MIRTEC to Display Award-Winning 3D AOI and SPI Solutions during SMTAI Virtual Expo

Industry News | 2020-09-01 12:20:14.0

MIRTEC today announced its participation in the SMTA International Virtual Conference & Expo. The Live Virtual Exposition is scheduled to take place Sept. 28-30, 2020.

MIRTEC Corp

MIRTEC to Display Award-Winning 3D AOI and SPI Solutions at APEX 2021 Virtual EXPO

Industry News | 2021-02-08 15:18:29.0

MIRTEC is pleased to announce its participation in the 2021 IPC APEX Virtual EXPO, scheduled to take place March 9-11, 2021 online at www.ipcapexexpo.org.

MIRTEC Corp

MIRTEC to Exhibit Complete Line of Technologically Advanced 3D AOI and SPI Inspection Systems at IPC APEX 2020

Industry News | 2020-01-06 16:06:59.0

MIRTEC will premier its complete line of 3D AOI and SPI Inspection Systems in Booth #1900 at the 2020 IPC APEX EXPO. The premier technical conference and exhibition for the electronics manufacturing industry will take place Feb. 4-6, 2020 at the San Diego Convention Center.

MIRTEC Corp

KE-2050/KE-2060 Causes and Countermeasures of Patch Failure

Technical Library | 2023-07-22 02:26:05.0

Patch offset; Uneven patches throughout the substrate (each substrate is offset in a different way); Only part of the substrate is offset; Only certain components are offset; The patch Angle is offset; Component absorption error; Laser identification (component identification) error; Nozzle loading and unloading error; Mark (BOC mark, IC mark) identification error; Image recognition error (KE-2060 only); Analysis of the main reasons for throwing material. More information about KINGSUN please Contact US at jenny@ksunsmt.com or visit www.ksunsmt.com

DONGGUAN KINGSUN AUTOMATION TECHNOLOGY CO.,LTD

Methods to improve the speed of the SMT machine--KINGSUN

Industry News | 2023-08-12 13:48:10.0

In the SMT production process, considering the importance of the mounting speed of the SMT machine, many SMT machine manufacturers are making every effort to improve the speed of the SMT machine. KINGSUN technical team has analyzed the following main methods to improve the speed of the SMT machine:

DONGGUAN KINGSUN AUTOMATION TECHNOLOGY CO.,LTD

Vision Measuring Machine,image measuring machine,auto measuring instrument

Vision Measuring Machine,image measuring machine,auto measuring instrument

Videos

https://www.ascen.ltd/Products/PCB_board_assembly_system/vision_measurin/507.html Vision Measuring Machine and image measuring instrument can be used for dimensional accuracy measurement of various molds, aircraft, automobile, mobile phone, computer,

ASCEN Technology

image measuring instrument,Image measuring machine,image measuring system

image measuring instrument,Image measuring machine,image measuring system

Videos

https://www.ascen.ltd/Products/PCB_board_assembly_system/vision_measurin/507.html Vision Measuring Machine and image measuring instrument can be used for dimensional accuracy measurement of various molds, aircraft, automobile, mobile phone, computer,

ASCEN Technology


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