Industry News | 2003-06-23 08:31:21.0
Onetto will be responsible for worldwide manufacturing, materials management, quality, new product introduction, information technology, logistics and repair operations.
Industry News | 2022-04-06 12:02:37.0
Seika Machinery, Inc. is pleased to offer a wide range of Sawa ultrasonic cleaners. From portable, manual stencil cleaners to fully automatic systems like the Sawa Ecobrid cleaner that can clean and dry in just six minutes, there is a solution for any cleaning application including removal of particulates from nozzles, squeegees, pallets, misprints and other parts.
Industry News | 2020-12-11 20:33:25.0
SunzonTech give fresher a short introduction of a full automatic solder paste printer's working process. It is really benefit for a fresher. Take a look at it!
Industry News | 2018-12-18 08:23:17.0
Seoul, South Korea – As ‘Your Partner for Smart Factory Realization,’ Koh Young Technology will show how Artificial Intelligence-based solutions and machine learning offers more consistent inspection at the IPC APEX Expo during 29–31 January 2019 in San Diego, California. With the ongoing trend of Industry 4.0, Koh Young has begun unblocking the potential of Artificial Intelligence (AI) to improve throughput and production quality in several ways. The company will display an array of innovative solutions powered by AI at Booth 1908 in San Diego Convention Center.
Industry News | 2018-10-27 16:12:01.0
This year (2018) JTAG Technologies are proud to celebrate their 25th year of developing, supplying and supporting world-class board (PCBA) test and programming solutions based on IEEE Std 1149.x .
Industry News | 2003-02-20 09:01:54.0
The transaction expands Solectron's long-time relationship with IBM through a three-year supply agreement, and strengthens Solectron's post-manufacturing services offering.
Industry News | 2008-04-22 20:35:20.0
Agilent Technologies Inc. (NYSE: A) and the Zollner Group today announced that Zollner, a global electronics manufacturing services provider, has selected the Agilent Medalist x6000 Automated X-ray Inspection (AXI) system to enhance its test and inspection capabilities.
Industry News | 2010-04-22 20:57:37.0
San Diego - KIC, the leader of thermal process development and control products, and winner of multiple industry awards, announces that it was awarded the Innovation Award for Best Supplier of the Year 2010. The award was presented to the company during an April 21, 2010 ceremony that took place at the Shanghai Everbright Convention & Exhibition Center during NEPCON China 2010.
Industry News | 2010-04-14 21:28:49.0
Saint-Egrève, France - Vi TECHNOLOGY exhibits its full product range of AOI solutions to reduce defective PCBAs at Nepcon China 2010 at Shanghai, from April 20th to 22nd booth 4F10.
Technical Library | 2016-04-14 13:49:44.0
A system level test, usually built-in test (BIT), determines that one or more subsystems are faulty. These subsystems sent to the depot or factory repair facility, called units under test (UUTs) often pass that test, an event we call No-Fault-Found (NFF). With more-and more electronics monitored by BIT, it is more likely that an intermittent glitch will trigger a call for a maintenance action resulting in NFF. NFFs are often confused with false alarm (FA), cannot duplicate (CNDs)or retest OK (RTOK) events. NFFs at the depot are caused by FAs, CNDs, RTOKs as well as a number of other complications. Attempting to repair NFF scan waste precious resources, compromise confidence in the product, create customer dissatisfaction, and the repair quality remains a mystery. The problem is compounded by previous work showing that most failure indications calling for repair action at the system level are invalid. NFFs can be caused by real failures or may be a result of system level false alarms. Understanding the cause of the problem may help us distinguish between units under test (UUTs) that we can repair and those that we cannot. In calculating the true cost of repair we must account for wasted effort in attempting to repair unrepairable UUTs.This paper will shed some light on this trade-off. Finally, we will explore approaches for dealing with the NFF issue in a cost effective manner.
