Vision Mantis stereo inspection microscope viewer - What makes Mantis special
Stereo zoom microscopes, lenses, Video & BGA inspection systems. Custom Fiber Optic and Microscope Stage Illuminators and Software
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The CSM Instruments Micro-Hardness Tester provides over three decades of normal force range and thus is ideally suited to the mechanical characterization of hard coatings, thick soft coatings and bulk materials. It provides accurate and reproducible
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We supply good quality items from Hong Kong and China. AI machine parts, SMT nozzle, nozzle for adhesive machine (most brand), stencil clean rolls, solvent and metal squeegee. We also supply reflow profiler and metal stencil. Optical inspection microscope and assemblies per your demands. Anti-static floor tile and other anti-static products also avaliable.
Trinocular Stereo Zoom Microscope Systems are some of the best in the industry. We offer three different types of systems – our SSZ-II Series, NZ Series, and E-Series. Our SSZ-II Series is one of our most sought after trinocular microscopes. This s
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The Micro Scratch Tester is widely used to characterize adhesion failure of thin films and coatings, with a typical thickness below 5 µm. The MST is also used in the analysis of organic and inorganic; soft and hard coatings. Applications include thin
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The REVETEST® Scratch Testing instrument has become the industry standard for measuring hard-coated materials, with a typical coating thickness of several microns. Coatings may be organic or inorganic, covering Tribological, magnetic and decorative
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With over 60 years of manufacturing excellence, we are one of the world's innovative and dynamic microscope manufacturers. Our products deliver unrivaled ergonomics for improved accuracy, repeatability, and productivity.
Technical Library | 2021-09-21 20:36:45.0
The present paper gives an overview of surface failures, internal nonconformities and solders joint failures detected by microscopic analysis of electronic assemblies. Optical microscopy (stereomicroscopy) and Fourier-Transform- Infrared (FTIR) microscopy is used for documentation and failure localization on electronic samples surface. For internal observable conditions a metallographic cross-section analysis of the sample is required. The aim of this work is to present some internal and external observable nonconformities which frequently appear in electronic assemblies. In order to detect these nonconformities, optical microscopy, cross section analysis, FTIR-microscopy and scanning electron microscopy with energy dispersive spectrometry (SEM-EDS) were used as analytical techniques.
The MiniScope combines a digital movie camera, precision optics and LED lighting in a microscope that fits in the palm of your hand. 40 - 140X magnification lets you zoom in on the fine details of insects, textiles, electronics or anything else too s