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Pickering Interfaces to Show New PXI and LXI Switching Solutions at Auto Testing Expo 2017 Preview for Auto Testing Expo – Detroit, MI – October 24 - 26

Industry News | 2017-10-15 18:00:10.0

Pickering Interfaces will showcase their latest high-density PXI and Ethernet LXI Switching & Simulation Solutions at Auto Testing Expo 2017 in booth 11046, in Detroit, MI, including:

Pickering Interfaces Ltd.

Pickering Interfaces to Highlight New PXI and LXI Switching Solutions at the International Test Expo 2017 Preview for ITC – Ft. Worth, TX – October 21 - November 2

Industry News | 2017-10-17 19:05:59.0

Pickering Interfaces will highlight their latest high-density PXI and Ethernet LXI Switching & Simulation Solutions at the International Test Conference (ITC) 2017 in booth 501, in Ft. Worth, including:

Pickering Interfaces Ltd.

Pickering Interfaces to Highlight New PXI and LXI Switching Solutions at the International Test Expo 2017 Preview for ITC – Ft. Worth, TX – October 21 - November 2

Industry News | 2017-10-30 20:39:58.0

Pickering Interfaces will highlight their latest high-density PXI and Ethernet LXI Switching & Simulation Solutions at the International Test Conference (ITC) 2017 in booth 501, in Ft. Worth, including:

Pickering Interfaces Ltd.

Press Release for Apex 2023

Industry News | 2023-01-16 07:16:27.0

Customers looking for leading-edge test solutions can come to Seica's booth 2511 and view the newest line of Flying Probe test on the market in the form of the PILOT VX platform, bed of nails ICT solutions, the Compact LR, and Mini200 and the latest conformal coat inspection systems, the Dragonfly.

SEICA SpA

Agilent E5515C-002-003-E1963A-403-E1963A-413-E1968A-410-E1987A-E 1991B - See more at: http://www.testequipmentconnection.com/70769/Agilent_E5515C-002-003-E1963A-403-E1963A-413-E1968A-410-E1987A-E_1991B

Agilent E5515C-002-003-E1963A-403-E1963A-413-E1968A-410-E1987A-E 1991B - See more at: http://www.testequipmentconnection.com/70769/Agilent_E5515C-002-003-E1963A-403-E1963A-413-E1968A-410-E1987A-E_1991B

Used SMT Equipment | In-Circuit Testers

Agilent-Keysight E5515C-002-003-E1963A-403-E1963A-413-E1968A-410-E1987A-E 1991B 8960 Series 10 Wireless Communications Test Set The industry standard for high-speed, accurate and reliable RF measurements, coupled with flexible network emulation

Test Equipment Connection

Allen-Bradley 1771-IFM  Input Module Fast Millivolt

Allen-Bradley 1771-IFM Input Module Fast Millivolt

New Equipment | Industrial Automation

Sales Manager: Sandy Lin Email:  unity@mvme.cn Skype:  onlywnn_1 Mobile(Whatsapp): (+86)-18020776786   XIAMEN YUEHANG COMPUTER ENGINEERING CO.LTD. is a company that professionally engaged in large system DCS spare parts supply. We supply DCS, PLC, M

XIAMEN YUEHANG COMPUTER ENGINEERING CO.LTD.

Allen-Bradley 1771-IFM  Input Module Fast Millivolt

Allen-Bradley 1771-IFM Input Module Fast Millivolt

New Equipment | Industrial Automation

Sales Manager: Sandy Lin Email:  unity@mvme.cn Skype:  onlywnn_1 Mobile(Whatsapp): (+86)-18020776786   XIAMEN YUEHANG COMPUTER ENGINEERING CO.LTD. is a company that professionally engaged in large system DCS spare parts supply. We supply DCS, PLC, M

XIAMEN YUEHANG COMPUTER ENGINEERING CO.LTD.

alignment requirements for 0.5mm pitch

Electronics Forum | Tue May 07 08:18:12 EDT 2002 | Sir Alexandr

Almst quality of PCB with this pitch defined on used boards. Good board produses Fullmarks , look up to it , stencil parametrs isnt so critical but board material and layouts.

Universal Axial Model 6287A communication

Electronics Forum | Sat Mar 17 13:53:47 EDT 2018 | introlab

Hi . When you reload the exe file to machine you must configurate the system by type sys in terminal and define some parametrs

Adhesive Printing

Electronics Forum | Thu Mar 14 22:10:24 EST 2002 | alex_kirichenko

We always print adhesives.. And don't really have problems.. as long as your stencil is right and glue doesn't stay in appetures after first print. The parametrs same as for paste.. You can run it faster, but we don't have big enough runs to bother


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