Full Site - : passive component shear test (Page 40 of 45)

ICT testing to improve yields

Electronics Forum | Mon Aug 27 08:36:52 EDT 2012 | rway

The process is currently being performed by hand. > I am trying to automate the process by switching > to pick and place equipment and using > AOI. > > Problem number one is getting my customer > to sign off on switching from hand assembly to >

Re: Help I need DATA on Thermal shock caused by REWORK!

Electronics Forum | Sat Oct 02 03:27:52 EDT 1999 | Brian

| I am currently in the middle of a company wide war and I'm looking for data (AMMO). Here are the problems: | | 1) I am looking for anyone who has done or seen any reports on Thermal Shock to smt parts and/or via holes caused by Soldering Irons at

Re: Microcracking in SMT Pick&Place process

Electronics Forum | Thu Jun 25 09:37:48 EDT 1998 | Russ Miculich

The real causes of microcracking are not normally due to pick and place - particularly if you are using a piece of equipment with vacuum pick up and release. The real cause of microcracking is due to thermal stresses on the die and the choice of the

Re: all powerfull UP78..or is it..? - Homeplates..??

Electronics Forum | Sat May 08 07:41:00 EDT 1999 | wayne sanita

hello, i have been using up-78 ultraprint for over a year now. at first we were getting lots of solder balls mainly on 0805's. this happened with all paste we used, too much solder under component leads. i have been using apertures reduced 10% homepl

Re: Help I need DATA on Thermal shock caused by REWORK!

Electronics Forum | Sat Oct 02 20:19:19 EDT 1999 | John Dwinell

| | I am currently in the middle of a company wide war and I'm looking for data (AMMO). Here are the problems: | | | | 1) I am looking for anyone who has done or seen any reports on Thermal Shock to smt parts and/or via holes caused by Soldering Ir

Re: BGA Inspection Criteria

Electronics Forum | Sun Dec 10 11:55:16 EST 2000 | Bob Willis

The following may be of interest to you. INTRODUCTION TO X-RAY INSPECTION All text Copyright Bob Willis, EPS INTRODUCTION TO X-RAY INSPECTION The use of X-ray inspection is becoming very popular due to the increased use of Ball Grid Array (BGA)

Re: BGA Inspection Criteria

Electronics Forum | Sun Dec 10 11:55:28 EST 2000 | Bob Willis

The following may be of interest to you. INTRODUCTION TO X-RAY INSPECTION All text Copyright Bob Willis, EPS INTRODUCTION TO X-RAY INSPECTION The use of X-ray inspection is becoming very popular due to the increased use of Ball Grid Array (BGA)

Re: BGA Inspection Criteria

Electronics Forum | Sun Dec 10 11:56:05 EST 2000 | Bob Willis

The following may be of interest to you. INTRODUCTION TO X-RAY INSPECTION All text Copyright Bob Willis, EPS INTRODUCTION TO X-RAY INSPECTION The use of X-ray inspection is becoming very popular due to the increased use of Ball Grid Array (BGA)

aluminium wire bonding on Electroless Nickel + Immersion gold

Electronics Forum | Mon Aug 27 15:06:29 EDT 2001 | davef

This otta push Wolfgang over the top ... Recommended reading G.G. Harman, Wire Bonding in Microelectronics : Materials, Processes, Reliability, and Yield, 2nd edition, McGraw-Hill Electronic Packaging and Interconnection Series, 1997. G.G. Harman, R


passive component shear test searches for Companies, Equipment, Machines, Suppliers & Information